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The present tool and method relate to device fault detection, diagnosis and prognosis. More particularly, the present tool and method store in a database a plurality of measured indicators representative of at least one dynamic condition of the device. The present tool and method further binarize by a processor the plurality of measured indicators, and analyze the plurality of binarized measured indicators using a machine learning data tool for extracting at least one pattern from the binarized measured indicators by adding at least one different constraint to each iteration. The at least one extracted pattern is indicative of whether the device has a fault or not.