作者
David Bergström, John Powell, AFH Kaplan
发表日期
2007/6/1
期刊
Journal of applied physics
卷号
101
期号
11
出版商
AIP Publishing
简介
Ray tracing has been employed to investigate the absorption of light by smooth and random rough metal surfaces. For normally incident light the absorptance of the surface increases with surface roughness. However, for light incident at a tangent to the surface the absorptance-surface roughness relationship is more complex. For example, in certain cases the absorptance can rise, fall, and rise again as the surface roughness increases. In this paper this complex absorptance-roughness relationship is defined and explained. The wavelengths of the light chosen for this study correspond to the primary and secondary output wavelengths of Nd: YAG lasers.
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