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We report Raman scattering and x-ray diffraction studies of polycrystalline (CCTO) under high pressures. The pressure dependence of several Raman modes was investigated. No anomalies have been observed on the phonon spectra thereby indicating that the structure remains stable up to the maximum pressure we reached in this experiment. The pressure coefficients for the observed Raman modes were determined. This set of parameters was used for evaluating the stress developed in CCTO thin films. The high-pressure x-ray studies were extended up to and the data confirmed that the structure remains stable up to this pressure. The pressure-volume data are well described by the Birch’s equation of state. The experimental value of the zero pressure bulk modulus is . Grüneisen parameters of CCTO were also determined.