作者
Amr S Abdelfattah, Tomas Cerny, Jorge Yero, Eunjee Song, Davide Taibi
发表日期
2024/5/13
期刊
Electronics
卷号
13
期号
10
页码范围
1913
出版商
MDPI
简介
Test coverage is a critical aspect of the software development process, aiming for overall confidence in the product. When considering cloud-native systems, testing becomes complex, as it becomes necessary to deal with multiple distributed microservices that are developed by different teams and may change quite rapidly. In such a dynamic environment, it is important to track test coverage. This is especially relevant for end-to-end (E2E) and API testing, as these might be developed by teams distinct from microservice developers. Moreover, indirection exists in E2E, where the testers may see the user interface but not know how comprehensive the test suits are. To ensure confidence in health checks in the system, mechanisms and instruments are needed to indicate the test coverage level. Unfortunately, there is a lack of such mechanisms for cloud-native systems. This manuscript introduces test coverage metrics for evaluating the extent of E2E and API test suite coverage for microservice endpoints. It elaborates on automating the calculation of these metrics with access to microservice codebases and system testing traces, delves into the process, and offers feedback with a visual perspective, emphasizing test coverage across microservices. To demonstrate the viability of the proposed approach, we implement a proof-of-concept tool and perform a case study on a well-established system benchmark assessing existing E2E and API test suites with regard to test coverage using the proposed endpoint metrics. The results of endpoint coverage reflect the diverse perspectives of both testing approaches. API testing achieved 91.98% coverage in the …
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