作者
Saied Tehrani, Jon M Slaughter, Mark Deherrera, Brad N Engel, Nicholas D Rizzo, John Salter, Mark Durlam, Renu W Dave, Jason Janesky, Brian Butcher, Ken Smith, Greg Grynkewich
发表日期
2003/5/21
期刊
Proceedings of the IEEE
卷号
91
期号
5
页码范围
703-714
出版商
IEEE
简介
Magnetoresistive random access memory (MRAM) technology combines a spintronic device with standard silicon-based microelectronics to obtain a combination of attributes not found in any other memory technology. Key attributes of MRAM technology are nonvolatility and unlimited read and write endurance. Magnetic tunnel junction (MTJ) devices have several advantages over other magnetoresistive devices for use in MRAM cells, such as a large signal for the read operation and a resistance that can be tailored to the circuit. Due to these attributes, MTJ MRAM can operate at high speed and is expected to have competitive densities when commercialized. In this paper, we review our recent progress in the development of MTJ-MRAM technology. We describe how the memory operates, including significant aspects of reading, writing, and integration of the magnetic material with CMOS, which enabled our recent …
引用总数
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S Tehrani, JM Slaughter, M Deherrera, BN Engel… - Proceedings of the IEEE, 2003