作者
Frederick T. Sheldon, Krishna M. Kavi, Robert C Tausworthe, James T. Yu, Ralph Brettschneider, William W. Everett
发表日期
1992/7
期刊
IEEE Software
卷号
9
期号
4
页码范围
13-20
出版商
IEEE
简介
The gap between theory and practice of reliability measurement in software design is discussed, and key issues that underlie reliability measurement's evolution from theory to practice are presented. A panel discussion in which reliability measurement's salient issues, basic concepts, and underlying theory are outlined is included. Reliability measurement's role in the development life cycle is also discussed.< >
引用总数
学术搜索中的文章
FT Sheldon, KM Kavi, RC Tausworthe, JT Yu… - IEEE Software, 1992