作者
Faiq Khalid, Syed Rafay Hasan, Osman Hasan, Falah Awwad
发表日期
2016/10/1
期刊
Journal of Electronic Testing
卷号
32
期号
5
页码范围
569-586
出版商
Springer US
简介
Glitches due to the secondary neutron particles from cosmic rays cause soft errors in integrated circuits (IC) that are becoming a major threat in modern sub 45nm ICs. Therefore, researchers have developed many techniques to mitigate the soft errors and some of them utilize the built in error detection schemes of low-power asynchronous null conventional logic (NCL). However, it requires extensive simulations and emulations for careful and complete analysis of the design, which can be costly, time consuming and cannot encompass all the possible input conditions. In this paper, we propose a framework to improve the soft error tolerant asynchronous pipelines by identifying and formally analyzing the vulnerable paths using the nuXmv model checker. The proposed framework translates the design behavior and specification into a state-space model and the potential vulnerabilities against soft errors in the …
引用总数
201920202021202220232024121121
学术搜索中的文章