作者
Florian Kriebel, Semeen Rehman, Muhammad Abdullah Hanif, Faiq Khalid, Muhammad Shafique
发表日期
2018/7/8
研讨会论文
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
页码范围
581-586
出版商
IEEE
简介
In recent years, the exponential growth of internet of things (IoT) and cyber physical systems (CPS) in safety critical applications has imposed severe reliability and security challenges. This is due to the heterogeneity and complex connectivity of the CPS components as well as error-prone and vulnerable nature of the underlying devices, harsh operating environments, and escalating security attacks. Different reliability threats (like soft errors, process variation and the temperature-induced dark silicon problem) have posed diverse challenges, which led to the development of various mitigation techniques on different layers of the CPS/IoT stack. Similarly, security threats (like manipulation of communication channels, hardware components and associated software) led to the development of different detection and protection techniques on different layers of the CPS/IoT stack, e.g., cross-layer and intra-layer connectivity …
引用总数
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