作者
Aaron D Sinnott, Adam Kelly, Cian Gabbett, Jose Munuera, Luke Doolan, Matthias Möbius, Stefano Ippolito, Paolo Samorì, Jonathan N Coleman, Graham LW Cross
发表日期
2024/3
期刊
Advanced Materials
卷号
36
期号
9
页码范围
2306954
简介
Thin film networks of solution processed nanosheets show remarkable promise for use in a broad range of applications including strain sensors, energy storage, printed devices, textile electronics, and more. While it is known that their electronic properties rely heavily on their morphology, little is known of their mechanical nature, a glaring omission given the effect mechanical deformation has on the morphology of porous systems and the promise of mechanical post processing for tailored properties. Here, this work employs a recent advance in thin film mechanical testing called the Layer Compression Test to perform the first in situ analysis of printed nanosheet network compression. Due to the well‐defined deformation geometry of this unique test, this work is able to explore the out‐of‐plane elastic, plastic, and creep deformation in these systems, extracting properties of elastic modulus, plastic yield, viscoelasticity …
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