发明者
Jung Tae Lee, Chung Ung Kim, Young Goun Lee, Jin Beom Hong
发表日期
2014/12/11
专利局
US
专利申请号
13930772
简介
A test apparatus is provided for rapidly detecting abnormal loading of a microfluidic device, and unloading the abnor mally-loaded microfluidic device, thereby preventing con tamination of the test apparatus by a sample and degradation in reliability of test results. A test system including the test apparatus and a control method for the test apparatus are also provided. The test apparatus includes an optical sensor to photograph an image at a position corresponding to the microfluidic device, and a controller to detect a pattern formed on a surface of the microfluidic device based on the photographed image to determine whether characteristics of the detected pattern are identical to characteristics of a pre stored pattern, and to determine whether the microfluidic device has not been normally loaded, when the characteristics of the detected pattern are different from the characteristics of the pre-stored pattern.
引用总数