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POLYMER BRUSHES POSSESSING MATRIX (PS)-DISPERSED (PMMA) MORPHOLOGIES WERE PREPARED FROM VARIOUS BRUSHES ON A SUBSTRATE VIA SINGLE CRYSTAL PATTERNING WITH SELF-SEEDING TECHNIQUE IN A DILUTE SOLUTION. IN ACCORD WITH VARIOUS QUALITIES OF EMPLOYED SOLVENT AND DIFFERENT INTERACTIONS OF SUBSTRATE WITH AMORPHOUS BLOCKS, THE MIXED-BRUSH MORPHOLOGIES COULD BE OBTAINED ON THE PEG SINGLE CRYSTALS. THESE OBSERVATIONS ASCRIBED TO SOMEHOW HIGH POLYDISPERSITY INDEX (PDI). DIFFERENT PHASE REGIONS WERE DETECTABLE BY ATOMIC FORCE MICROSCOPY (AFM) DUE TO HAVING DIFFERENT HEIGHTS AND STIFFNESSES. THE DOMAIN SIZE OF DISPERSED PHASE DECREASED WITH ENHANCING THE MOLECULAR WEIGHTS OF PS AND PMMA BLOCKS, FOR HINDRANCE INCREASE AGAINST PRESENCE OF PEG-B-PMMA CHAINS. THE DOMAIN SIZE OF THE DISPERSED PHASE RANGED FROM 286 TO 351 NM. VIA ELEVATING THE CRYSTALLIZATION TEMPERATURE, THE THICKNESS AND, CONSEQUENTLY, THE TETHERING DENSITY ENHANCEMENT WAS MORE CONSIDERABLE FOR PS REGIONS, AND IT ASCRIBED TO THE LOWER OSMOTIC PRESSURE OF PS BRUSHES.