作者
Chi-Hui Chien, Thaiping Chen, Yii-Tay Chiou, Chi-Chang Hsieh, Yii-Der Wu, Chung-Ting Wang
发表日期
2004/5/16
研讨会论文
2004 24th International Conference on Microelectronics (IEEE Cat. No. 04TH8716)
卷号
2
页码范围
637-640
出版商
IEEE
简介
In this present paper, the stability equations foe the PBGA package's warpage without the solder balls subjected to hygro-thermal loading, by modeled as an initial perfect composite plate, have been developed. The analytical closed-form solutions are found and used to compute not only the critical moisture contents but also the warpage before reaching the critical loads. The buckling of the PBGA packages, at the solder reflow peak temperature, occurs, when the theoretical moisture contents reach 0.259-0.283%w. These theoretically critical moisture contents accurately predict the experimental critical moisture contents 0.25-0.30%w from our previous work. However, the buckling occurs theoretically in the initial perfect package's structures at room temperature, but not occur practically. The structures of the PBGA package before buckling become stress-free at the moisture content 0.077%w and at the room …
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CH Chien, T Chen, YT Chiou, CC Hsieh, YD Wu… - … International Conference on Microelectronics (IEEE Cat …, 2004