作者
Deepak K Pandey, Ting Fung Chung, G Prakash, R Piner, Yong P Chen, R Reifenberger
发表日期
2011/9/1
期刊
Surface Science
卷号
605
期号
17-18
页码范围
1669-1675
出版商
North-Holland
简介
Graphene Oxide (GO) sheets, suspended in an aqueous solution, were deposited on freshly cleaved highly oriented pyrolytic graphite (HOPG) and studied using Raman spectroscopy, atomic force microscopy (AFM) and scanning tunneling microscopy (STM). AFM phase imaging shows a distinct contrast between GO and the underlying HOPG substrate. Raman spectroscopy clearly showed the presence of GO sheets on the top of HOPG substrate. The AFM and STM images also reveal wrinkling, folding, and tearing of individual GO sheets after depositing onto an HOPG substrate. We have also observed a distinct cracking of a GO sheet after folding. We attribute this new cracking phenomenon to a weakening of C–C bonds during the oxidation of a graphene sheet.
引用总数
201120122013201420152016201720182019202020212022202320241216258434612
学术搜索中的文章
DK Pandey, TF Chung, G Prakash, R Piner, YP Chen… - Surface Science, 2011