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The elastic constants (compliances of a textured anisotropic thin film deposited on a substrate have been determined. Using x-ray diffraction to measure the intragranular strain and a tensile machine to deform in situ the samples, an analytical method is described and has been developed for fiber textured thin films. The determination of thin film compliances only requires the knowledge of the substrate elastic constants. In the case of a 260-nm-thin gold film, the compliances were found to be slightly different from the corresponding bulk material ones.