作者
Yuhua Cheng, M Jamal Deen, Chih-Hung Chen
发表日期
2005/6/27
期刊
IEEE Transactions on Electron Devices
卷号
52
期号
7
页码范围
1286-1303
出版商
IEEE
简介
High-frequency (HF) modeling of MOSFETs for radio-frequency (RF) integrated circuit (IC) design is discussed. Modeling of the intrinsic device and the extrinsic components is discussed by accounting for important physical effects at both dc and HF. The concepts of equivalent circuits representing both intrinsic and extrinsic components in a MOSFET are analyzed to obtain a physics-based RF model. The procedures of the HF model parameter extraction are also developed. A subcircuit RF model based on the discussed approaches can be developed with good model accuracy. Further, noise modeling is discussed by analyzing the theoretical and experimental results in HF noise modeling. Analytical calculation of the noise sources has been discussed to understand the noise characteristics, including induced gate noise. The distortion behavior of MOSFET and modeling are also discussed. The fact that a MOSFET …
引用总数
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学术搜索中的文章
Y Cheng, MJ Deen, CH Chen - IEEE Transactions on Electron Devices, 2005