作者
Tetsuaki Matsunawa, Hirokazu Nosato, Hidenori Sakanashi, Masahiro Murakawa, Nobuharu Murata, Tsuneo Terasawa, Toshihiko Tanaka, Nobuyuki Yoshioka, Osamu Suga, Tetsuya Higuchi
发表日期
2005/11/9
研讨会论文
25th Annual BACUS Symposium on Photomask Technology
卷号
5992
页码范围
1478-1486
出版商
SPIE
简介
This paper proposes a new approach to optical proximity correction (OPC) using an adjustable OPCed cell and genetic algorithms (GA) to achieve optimal OPC feature generation for the full-chip area at fast operational speeds. GA is an efficient optimization technique based on population genetics. In this new approach, an adjustable OPCed cell consists of two parts. The first part is the original design data. The second part consists of two kinds of OPC features. The first kind is referred to as "fixed features", which include OPC feature data from a conventional OPC technique. The second kind, named "adjustable features", are located in the peripheral regions of the cell and include adjustable OPC variables. As the values of these variables are greatly influenced by neighboring cell patterns, the variables are quickly optimized by the GA after chip layout. The effectiveness of this approach, in terms of reduced …
引用总数
2006200720082009201020112012201347112
学术搜索中的文章
T Matsunawa, H Nosato, H Sakanashi, M Murakawa… - 25th Annual BACUS Symposium on Photomask …, 2005