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We report high-resolution polarization-dependent resonant inelastic x-ray scattering (RIXS) at the O resonance of NiO showing a rich excitation spectrum. We perform multisite cluster model cal<?format ?>culations, revealing that solid state effects are substantial. We identify a nonlocal charge transfer exci<?format ?>tation at 4–5 eV and double-singlet creation at 1.75 eV, both exhibiting significant scattering geometry dependence. Apart from an intense band of local charge transfer excitations (above 5 eV) also exci<?format ?>tations at 1 eV are observed. Finally, we point out that O RIXS of correlated metal oxides allows a quan<?format ?>titative and consistent determination of the charge transfer energy and the Hund coupling energy .