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Electric double layer capacitors (EDLCs) are promising energy storage solutions, yet aging and degradation issues impede reliability and lifespan. The research proposes integrated simulation, modeling, and optimization to actively control EDLC degradation during charge-discharge cycles, mathematically modeling and simulating electrical and aging dynamics. These aging simulations are coupled with a genetic algorithm (GA) optimization routine that identifies the optimal combinations of influential EDLC parameters like internal resistance and capacitance for mitigating deterioration. Equivalent circuit models quantify electrical signatures, as aging factors induce gradual drifts in capacitance and resistance during thousands of simulated operational cycles. These MATLAB simulations effectively capture aging phenomena noted in real EDLCs in terms of measurable capacitance fading and resistance growth …