Janusz Rajski

Janusz Rajski

Vice President of Engineering, Siemens
在 mentor.com 的电子邮件经过验证
被引用次数：16213
Electronic Design Automation VLSI Testing Design For Test
Bashir M. Al-Hashimi

Bashir M. Al-Hashimi

Professor of Computer Engineering, King's College London
在 kcl.ac.uk 的电子邮件经过验证
被引用次数：11411
Energy-efficient computing embedded systems design for test
Mehdi B. Tahoori

Mehdi B. Tahoori

Professor of Computer Science, Karlsruhe Institute of Technology, Germany
在 kit.edu 的电子邮件经过验证
被引用次数：10793
reliable computing printed electronics electronic design automation design for test emerging technologies
Wu-Tung Cheng

Wu-Tung Cheng

chief scientist, mentor graphics
在 mentor.com 的电子邮件经过验证
被引用次数：6499
design for test
Nilanjan Mukherjee

Nilanjan Mukherjee

Senior Engineering Director, Siemens Digital Industries Software
在 mentor.com 的电子邮件经过验证
被引用次数：6024
Design-for-Test Memory Testing ATPG Fault simulation Compression
Tim Cowles

Tim Cowles

TIE - Texas Institute For Electronics
在 austin.utexas.edu 的电子邮件经过验证
被引用次数：2443
DRAM & Emerging Memory Semiconductors Design For Test Cloud
Erik Larsson

Erik Larsson

Lunds Universitet
在 eit.lth.se 的电子邮件经过验证
被引用次数：2136
Design for test test fault tolerance
Érika Cota

Érika Cota

Universidade Federal do Rio Grande do Sul
在 inf.ufrgs.br 的电子邮件经过验证
被引用次数：1994
test of embedded systems software test hardware test design for test
Naghmeh Karimi

Naghmeh Karimi

Associate Professor, Computer Science & Electrical Eng., University of Maryland Baltimore …
在 umbc.edu 的电子邮件经过验证
被引用次数：1572
Hardware Security & Reliability Design-for-Security Design-for-Reliability Design-for-Test VLSI
Diego Vázquez

Diego Vázquez

Profesor, Universidad de Sevilla, IMSE-CNM-CSIC
在 us.es 的电子邮件经过验证
被引用次数：1314
Design&Test analog&RF microelectronic Mixed-Signal ICs Design-for-Test ASICs for Space
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