Jonathan Ahlbin

Jonathan Ahlbin

Senior Electrical Engineer at the University of Southern California - Information Sciences …
在 isi.edu 的电子邮件经过验证
被引用次数：1930
Semiconductors Microelectronic Reliability VLSI Design Radiation Effects in Electronics Ultra-low Power Design
Pridhvi Dandu

Pridhvi Dandu

Sr Hardware Engineer, Arris international
在 arris.com 的电子邮件经过验证
被引用次数：61
Heat transfer Electronics cooling Thermal Design Thermal Management of microelectronics Microelectronic Reliability
Mohammad Amirul Affiz Afripin

Mohammad Amirul Affiz Afripin

NXP Semiconductors
在 live.utm.my 的电子邮件经过验证
被引用次数：31
Computational Solid Mechanics Microelectronic Reliability Bus Rollover Regulation 66 Crashworthiness