Roger Proksch

Roger Proksch

Asylum Research
在 oxinst.com 的电子邮件经过验证
被引用次数：10890
Nanotechnology Nanoscale functional materials atomic force microscopy nanoscale metrology
Adrian Pegoraro

Adrian Pegoraro

Research Officer, National Research Council of Canada
在 nrc-cnrc.gc.ca 的电子邮件经过验证
被引用次数：5212
Photonics Cell Mechanics Nanoscale Metrology
Zygmunt J. Jakubek

Zygmunt J. Jakubek

National Research Council Canada, Metrology Research Center
在 nrc.ca 的电子邮件经过验证
被引用次数：2373
photophysics fluorescence microscopy fluorescence spectroscopy nanomaterials nanoscale metrology
Damiano Nardi

Damiano Nardi

JILA - University of Colorado, Boulder
在 jila.colorado.edu 的电子邮件经过验证
被引用次数：876
Lasers X-rays ultrafast science nanoscale metrology
Christopher Perez Luna

Christopher Perez Luna

Thermal design engineer at Apple Inc.
在 alumni.stanford.edu 的电子邮件经过验证
被引用次数：289
Nanoscale thermal transport Pump-probe measurements Photonics Nanoscale metrology Thin film
Dhairya Dixit

Dhairya Dixit

Intel
在 intel.com 的电子邮件经过验证
被引用次数：163
Scatterometry Semiconductor metrology Nanoscale metrology Mueller matrix