Rajeev Kumar Jaisawal

Rajeev Kumar Jaisawal

Research Scholar PDPM IIITDM Jabalpur
在 iiitdmj.ac.in 的电子邮件经过验证
被引用次数：273
FinFET Negative Capacitance Nanosheet FET Self-Heating Effects Device Reliability
Sresta Valasa

Sresta Valasa

National Institute of Technology Warangal
在 student.nitw.ac.in 的电子邮件经过验证
被引用次数：242
Device Modeling Device-Circuit Codesign Issues Nanosheet FET Negative Capacitance
Ram Krishna Dewangan

Ram Krishna Dewangan

Assistant Professor, Department of Electronics & Telecomm., Government Engineering …
在 gecjdp.ac.in 的电子邮件经过验证
被引用次数：23
VLSI Design Nanoscale Devices FinFET Nanosheet FET Microelectronics
Ch.Lakshmana

Ch.Lakshmana

Indian Institute of Information Technology Design and Manufacturing Kurnool (IIITDM …
在 iiitk.ac.in 的电子邮件经过验证
被引用次数：4
Semiconductor Devices VLSI NANOSHEET FET TFET Multi Stage Op- Amp