fawzi ikraiam

fawzi ikraiam

Professor of Physics, Omar Al-Mukhtar University
在 omu.edu.ly 的电子邮件经过验证
被引用次数：4276
Nuclear Physics Semiconductor Device Characterization
zhigang ji

zhigang ji

Shanghai Jiaotong University
在 sjtu.edu.cn 的电子邮件经过验证
被引用次数：2238
Semiconductor device reliability Semiconductor device modelling Semiconductor device characterization
Anup Sasikumar

Anup Sasikumar

Texas Instruments
被引用次数：793
Solid State Electronic Devices Reliability Semiconductor Device Characterization
Wojciech Wiatr

Wojciech Wiatr

Warsaw University of Technology, Institute of Electronic Systems
在 elka.pw.edu.pl 的电子邮件经过验证
被引用次数：695
metrology semiconductor device characterization circuit design microwave frequencies
Branimir Pejcinovic

Branimir Pejcinovic

Portland State University
在 pdx.edu 的电子邮件经过验证
被引用次数：492
Semiconductor device characterization modeling and design THz material characterization EMI education research
Anibal Pacheco

Anibal Pacheco

Autonomous University of Barcelona
在 uab.cat 的电子邮件经过验证
被引用次数：394
semiconductor device characterization semiconductor device modeling parameter extraction 1DFET 2DFET
Mehmet Ozdogan, PhD

Mehmet Ozdogan, PhD

Process Engineer at Intel
被引用次数：157
Semiconductor Device Characterization MEMS-NEMS Design and Fabrication
Mathias Weiser

Mathias Weiser

Research Assistant
在 ilh.uni-stuttgart.de 的电子邮件经过验证
被引用次数：52
Semiconductor Device Characterization Semiconductor Device Modeling
Dr. Vikas A

Dr. Vikas A

National Institute of Technology Patna.
在 nitp.ac.in 的电子邮件经过验证
被引用次数：12
Semiconductor Device characterization Nanoscale TFET devices Heterojunction devices
Sanjay Shrirang Mane

Sanjay Shrirang Mane

Infineon Technologies AG
在 infineon.com 的电子邮件经过验证
被引用次数：9
Compact Device Modeling Semiconductor Device Characterization Reliability Modeling