zhigang ji

zhigang ji

Shanghai Jiaotong University
在 sjtu.edu.cn 的电子邮件经过验证
被引用次数：2225
Semiconductor device reliability Semiconductor device modelling Semiconductor device characterization
Johannes Schlipf

Johannes Schlipf

Lehrstuhl für Funktionelle Materialien, TU München
在 tum.de 的电子邮件经过验证
被引用次数：2176
X-ray & neutron scattering hybrid perovskite & thin film photovoltaics semiconductor device reliability
Miao Zhao

Miao Zhao

Microwave devices and integrated circuits department , Institute of microelectronics of …
在 ime.ac.cn 的电子邮件经过验证
被引用次数：1657
Semiconductor device reliability Graphene device development
Narendra Parihar

Narendra Parihar

Intel Corporation
在 intel.com 的电子邮件经过验证
被引用次数：1212
Advanced Logic Devices Semiconductor Device Reliability
Yue-Yang Liu (刘岳阳）

Yue-Yang Liu (刘岳阳）

Institute of Semiconductors, Chinese Academy of Sciences
在 semi.ac.cn 的电子邮件经过验证
被引用次数：991
semiconductor device reliability charge trapping
Craig Gaw

Craig Gaw

NXP Semiconductors, Inc.
在 nxp.com 的电子邮件经过验证
被引用次数：621
semiconductor device reliability
Udit Monga

Udit Monga

ams AG
在 ams.com 的电子邮件经过验证
被引用次数：236
Semiconductor device reliability Radiation effects Device modeling Machine learning
Kenneth J. Myers

Kenneth J. Myers

Northrop Grumman Corporation
在 ngc.com 的电子邮件经过验证
被引用次数：47
Electron Paramagnetic Resonance Electrically Detected Magnetic Resonance Semiconductor Device Reliability Defects in Semicond
Hatice Gül Sezgin-Ugranlı

Hatice Gül Sezgin-Ugranlı

Electrical and Electronics Engineering Assistant Professor, Bakırçay University
在 bartin.edu.tr 的电子邮件经过验证
被引用次数：29
Semiconductor Power Devices Semiconductor Device Reliability Circuit Design
Anirudh Varanasi

Anirudh Varanasi

Doctoral Researcher | IMEC & KU Leuven
在 imec.be 的电子邮件经过验证
被引用次数：10
Scientific Machine Learning Semiconductor Device Reliability