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Paras Ajay
Paras Ajay
Post-doctoral Researcher, University of Texas at Austin
在 utexas.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Ruthenium-assisted chemical etching of silicon: Enabling CMOS-compatible 3D semiconductor device nanofabrication
A Mallavarapu, P Ajay, C Barrera, SV Sreenivasan
ACS Applied Materials & Interfaces 13 (1), 1169-1177, 2020
322020
Enabling ultrahigh-aspect-ratio silicon nanowires using precise experiments for detecting the onset of collapse
A Mallavarapu, P Ajay, SV Sreenivasan
Nano Letters 20 (11), 7896-7905, 2020
272020
Fabricating large area multi-tier nanostructures
SV Sreenivasan, P Joseph, O Abed, M Grigas, A Mallavarapu, P Ajay
US Patent 9,941,389, 2018
252018
Multifield sub-5 nm overlay in imprint lithography
P Ajay, A Cherala, BA Yin, EE Moon, R Fabian Pease, SV Sreenivasan
Journal of Vacuum Science & Technology B 34 (6), 2016
122016
Simultaneous Micro-and Nanoscale Silicon Fabrication by Metal-Assisted Chemical Etch
RM Lema Galindo, P Ajay, SV Sreenivasan
Journal of Micro-and Nano-Manufacturing 10 (3), 031001, 2022
52022
Metal Assisted Chemical Etch of Polycrystalline Silicon
C Barrera, P Ajay, A Mallavarapu, M Hrdy, SV Sreenivasan
Journal of Micro-and Nano-Manufacturing 10 (2), 021002, 2022
42022
Large area metrology and process control for anisotropic chemical etching
SV Sreenivasan, A Mallavarapu, JG Ekerdt, MA Grigas, Z Ghaznavi, ...
US Patent App. 17/433,777, 2022
42022
Nano-Precision Systems for Overlay in Advanced Lithography Processes
P Ajay, SV Sreenivasan
Proceedings of the 4th International Conference on the Industry 4.0 Model …, 2019
42019
Nanofabrication and design techniques for 3D ICs and configurable ASICs
SV Sreenivasan, P Ajay, A Sayal, M Mcdermott, J Kulkarni
US Patent 12,079,557, 2024
32024
M2A2: Microscale Modular Assembled ASICs for High-Mix, Low-Volume, Heterogeneously Integrated Designs
A Sayal, P Ajay, MW McDermott, SV Sreenivasan, JP Kulkarni
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
32020
Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques
M Hrdy, A Mallavarapu, M Castañeda, P Ajay, SV Sreenivasan
Journal of Micro and Nano-Manufacturing 11 (1), 2023
22023
Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place
SV Sreenivasan, P Ajay, A Sayal, M Mcdermott, S Singhal, O Abed, ...
US Patent 12,009,247, 2024
12024
Processes and applications for catalyst influenced chemical etching
SV Sreenivasan, P Ajay, A Mallavarapu, C Barrera
US Patent App. 18/132,324, 2023
12023
Roll-to-roll programmable film imprint lithography
SV Sreenivasan, S Singhal, O Abed, L Dunn, P Ajay, O Ezekoye
US Patent 11,669,009, 2023
12023
Processes and applications for catalyst influenced chemical etching
SV Sreenivasan, P Ajay, A Mallavarapu, C Barrera
US Patent App. 18/090,471, 2023
12023
Nanofabrication and design techniques for 3d ics and configurable asics
SV Sreenivasan, P Ajay, A Sayal, M Mcdermott, J Kulkarni
US Patent App. 18/081,165, 2023
12023
Nanoscale-aligned three-dimensional stacked integrated circuit
SV Sreenivasan, P Ajay, A Sayal, O Abed, M Mcdermott, J Kulkarni, ...
US Patent 11,600,525, 2023
12023
Effect of initial conditions on uniformity of metal assisted chemical etch for ultra-high aspect ratio, taper-free silicon nanostructures
A Mallavarapu, M Hrdy, M Castaneda, P Ajay, SV Sreenivasan
Advanced Etch Technology and Process Integration for Nanopatterning XI …, 2022
12022
Multi-field overlay control in jet and flash imprint lithography
SV Sreenivasan, P Ajay, A Cherala
US Patent 10,191,368, 2019
12019
Reduction of backside particle induced out-of-plane distortions in semiconductor wafers
SV Sreenivasan, A Westfahl, P Ajay
US Patent App. 15/134,179, 2016
12016
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