| Characterization of the total charge and time duration for single-event transient voltage pulses in a 65-nm cmos technology Z Li, L Berti, J Wouters, J Wang, P Leroux IEEE Transactions on Nuclear Science 69 (7), 1593-1601, 2022 | 8 | 2022 |
| Memristor-assisted background calibration for SAR ADCs: A feasibility study Z Si, C Wang, X Jiang, Z Li, G Huang, A Serb, T Prodromakis, S Wang, ... IEEE Transactions on Circuits and Systems I: Regular Papers 70 (9), 3497-3508, 2023 | 2 | 2023 |
| Total Ionizing Dose Effects Sensitivity of Unsalicided Polysilicon Resistors MS Gorbunov, EH Boufouss, Z Li, B Vignon, MD van de Burgwal, L Berti, ... IEEE Transactions on Nuclear Science, 2024 | 1 | 2024 |
| A Novel Chest-based PPG Measurement System Q Lin, H Wang, D Biswas, Z Li, C Wang, E Lutin, C Van Hoof, M Chen, ... IEEE Journal of Translational Engineering in Health and Medicine, 2024 | | 2024 |
| A 10 MS/s 12-bit Cryogenic SAR ADC in 22nm FD SOI for Quantum Computing J Zhao, Z Li, Y Qing, Q Ma, C Wang, J Prinze, P Leroux 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), 60-64, 2024 | | 2024 |
| An 80MS/s 70.79 dB-SNDR 60.7 fJ/Conv-Step Radiation-Tolerant Semi-Time-interleaved Pipelined-SAR ADC Z Li, L Berti, Q Lin, J Zhao, M Gorbunov, G Thys, P Leroux 2024 IEEE Custom Integrated Circuits Conference (CICC), 1-2, 2024 | | 2024 |
| A CDAC Mismatch Calibration Technique for SAR-assisted Pipeline ADCs Z Li, L Berti, G Thys, P Leroux 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS), 1-5, 2023 | | 2023 |
| A 12-bit Successive Approximation Register Analog to Digital converter for Space Application in 22nm CMOS Technology K Harada, Z Li, SN Kim, A Yasuda, L Berti IEICE Conferences Archives, 2021 | | 2021 |
Paul LerouxFull professor, KU Leuven, Electrical Engineering (ESAT), Advanced Integrated Sensing Lab在 kuleuven.be 的电子邮件经过验证
