| Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography R Demoulin, M Roussel, S Duguay, D Muller, D Mathiot, P Pareige, ... The Journal of Physical Chemistry C 123 (12), 7381-7389, 2019 | 14 | 2019 |
| Infrared nanoplasmonic properties of hyperdoped embedded Si nanocrystals in the few electrons regime M Zhang, JM Poumirol, N Chery, C Majorel, R Demoulin, E Talbot, ... Nanophotonics 11 (15), 3485-3493, 2022 | 9 | 2022 |
| Origin of Pr3+ luminescence in hafnium silicate films: combined atom probe tomography and TEM investigations R Demoulin, G Beainy, C Castro, P Pareige, L Khomenkova, C Labbé, ... Nano Futures 2 (3), 035005, 2018 | 9 | 2018 |
| Influence of phosphorus on the growth and the photoluminescence properties of Si-NCs formed in P-doped SiO/SiO 2 multilayers F Trad, AE Giba, X Devaux, M Stoffel, D Zhigunov, A Bouché, S Geiskopf, ... Nanoscale 13 (46), 19617-19625, 2021 | 8 | 2021 |
| Atomic-scale study on the dopant distribution in phosphorus and boron-doped Si nanocrystals/SiO2 multilayers D Li, J Chen, Z Xue, T Sun, J Han, W Chen, E Talbot, R Demoulin, W Li, ... Applied Surface Science 609, 155260, 2023 | 7 | 2023 |
| Engineering of dense arrays of Vertical Si1-x Ge x nanostructures J Müller, A Lecestre, R Demoulin, F Cristiano, JM Hartmann, G Larrieu Nanotechnology 34 (10), 105303, 2022 | 6 | 2022 |
| Impact of surface reflectivity on the ultra-fast laser melting of silicon-germanium alloys D Ricciarelli, G Mannino, I Deretzis, G Calogero, G Fisicaro, R Daubriac, ... Materials Science in Semiconductor Processing 165, 107635, 2023 | 5 | 2023 |
| Heavily Doped Si Nanocrystals Formed in P-(SiO/SiO2) Multilayers: A Promising Route for Si-Based Infrared Plasmonics A Valdenaire, AE Giba, M Stoffel, X Devaux, L Foussat, JM Poumirol, ... ACS Applied Nano Materials 6 (5), 3312-3320, 2023 | 4 | 2023 |
| Correlation of luminescence measurements to the structural characterization of Pr3+-doped HfSiOx R Demoulin, L Khomenkova, C Labbe, F Gourbilleau, C Castro, P Pareige, ... Journal of Luminescence 235, 118004, 2021 | 4 | 2021 |
| Atomistic insights into ultrafast SiGe nanoprocessing G Calogero, D Raciti, D Ricciarelli, P Acosta-Alba, F Cristiano, R Daubriac, ... The Journal of Physical Chemistry C 127 (39), 19867-19877, 2023 | 3 | 2023 |
| Growth of BiSb on GaAs (001) and (111) A surfaces: A joint experimental and theoretical study D Sadek, A Jay, J El Hila, Q Gravelier, A Arnoult, R Demoulin, F Cristiano, ... Applied Surface Science 622, 156688, 2023 | 2 | 2023 |
| Hyperdoped Si nanocrystals embedded in silica for infrared plasmonics M Zhang, JM Poumirol, N Chery, H Rinnert, AE Giba, R Demoulin, ... Nanoscale 15 (16), 7438-7449, 2023 | 2 | 2023 |
| Impact of Nanosecond Laser Annealing on the Electrical Properties of Highly Boron-Doped Ultrathin Strained Si0.7Ge0.3 Layers R Daubriac, R Demoulin, S Kerdiles, P Acosta Alba, JM Hartmann, ... Electrochemical Society Meeting Abstracts 241, 1279-1279, 2022 | 2 | 2022 |
| Failure Mode Analysis in Microsecond UV Laser Annealing of Cu Thin Films R Demoulin, R Daubriac, L Thuries, E Scheid, F Rozé, F Cristiano, ... 2022 IEEE International Interconnect Technology Conference (IITC), 34-36, 2022 | 2 | 2022 |
| Correlated Structural and Luminescence Analysis of B‐Doped Si‐Nanocrystals Embedded in Silica R Demoulin, D Muller, D Mathiot, P Pareige, E Talbot physica status solidi (RRL)–Rapid Research Letters 14 (6), 2000107, 2020 | 2 | 2020 |
| Direct observation of the distribution of impurity in phosphorous/boron co-doped Si nanocrystals D Li, J Han, T Sun, J Chen, E Talbot, R Demoulin, W Chen, X Pi, J Xu, ... Chinese Physics B 32 (12), 126102, 2023 | 1 | 2023 |
| Impact of the Liquid/Solid Interface on the Strain State of Si1-XGex Layers Processed By Nanosecond Laser Annealing R Demoulin, R Daubriac, S Kerdiles, P Acosta Alba, JM Hartmann, ... Electrochemical Society Meeting Abstracts 241, 1278-1278, 2022 | 1 | 2022 |
| Etude structurale et cartographie du dopage dans des oxydes nanostructurés à base de sillicium. R Demoulin Normandie Université, 2019 | 1 | 2019 |
| Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography C Hatzoglou, G Da Costa, P Wells, X Ren, BP Geiser, DJ Larson, ... Microscopy and Microanalysis 29 (3), 1124-1136, 2023 | | 2023 |
| Study on the electrical properties of ultrathin in situ Boron-doped strained Si0. 7Ge0. 3 layers annealed by nanosecond pulsed laser R Daubriac, R Demoulin, S Kerdilès, P Acosta-Alba, M Opprecht, ... 2023 E-MRS Spring Meeting, 2023 | | 2023 |
