| High precision refractometry based on Fresnel diffraction from phase plates MT Tavassoly, R Rezvani Naraghi, A Nahal, K Hassani Optics Letters 37 (9), 1493-1495, 2012 | 55 | 2012 |
| Application of Fresnel diffraction from a phase step to the measurement of film thickness MT Tavassoly, I Moaddel Haghighi, K and Hassani Applied Optics 48 (29), 5497-5501, 2009 | 50 | 2009 |
| Nanometer displacement measurement using Fresnel diffraction AA Khorshad, K Hassani, MT Tavassoly Applied optics 51 (21), 5066-5072, 2012 | 47 | 2012 |
| Microstructure of ferroelectric domains in BaTiO 3 observed via X-ray microdiffraction M Holt, K Hassani, M Sutton Physical review letters 95 (8), 085504, 2005 | 40 | 2005 |
| Application of white light Fresnel diffractometry to film thickness measurement K Hassani, M Ashrafganjoie, MT Tavassoly Applied optics 55 (7), 1803-1807, 2016 | 21 | 2016 |
| Measurement of the full complex degree of coherence using Fresnel diffraction from a phase discontinuity H Hooshmand-Ziafi, M Dashtdar, K Hassani Optics Letters 45 (13), 3737-3740, 2020 | 12 | 2020 |
| Thin film characterization with a simple Stokes ellipsometer K Hassani, K Abbaszadeh European Journal of Physics 36 (2), 025017, 2015 | 11 | 2015 |
| Common-path spatial phase-shift speckle shearography using a glass plate H Hooshmand-Ziafi, M Dashtdar, K Hassani, M Motallebi-Araghi Review of Scientific Instruments 90 (10), 2019 | 10 | 2019 |
| Application of Fresnel diffraction from a phase step to determination of the spectral line profile K Hassani, A Jabbari, MT Tavassoly Journal of Optics 20 (9), 095606, 2018 | 10 | 2018 |
| Dual-sensitive spatial phase-shifting shearography based on a common-path configuration H Hooshmand-Ziafi, K Hassani, M Dashtdar Optical Engineering 58 (11), 114104-114104, 2019 | 8 | 2019 |
| X-ray diffraction imaging of strain fields in a domain-inverted LiTaO3 crystal K Hassani, M Sutton, M Holt, Y Zuo, D Plant Journal of Applied Physics 104 (4), 2008 | 8 | 2008 |
| Variation of index of refraction in the ion-exchanged glasses with the evolution of ionic and neutral silver nano-clusters A Nahal, A Jalehdoost, K Hassani, A Farokhniaee The European Physical Journal-Applied Physics 53 (1), 10701, 2011 | 6 | 2011 |
| Determination of the spectral line profile using a phase gradient step and stationary Fourier transform spectroscopy A Jabbari, K Hassani, MT Tavassoly Applied Optics 58 (19), 5353-5359, 2019 | 5 | 2019 |
| Surface profilometry using the incoherent self-imaging technique in reflection mode K Hassani, A Nahal, N Tirandazi Journal of Applied Physics 123 (3), 2018 | 4 | 2018 |
| Modified matching Ronchi test to visualize lens aberrations K Hassani, HH Ziafi European journal of physics 32 (5), 1385, 2011 | 4 | 2011 |
| X-ray microdiffraction imaging of a silicon microcantilever K Hassani, M Sutton, A Tkachuk, M Holt Journal of applied physics 101 (6), 2007 | 4 | 2007 |
| Applications of digital speckle pattern shearing interferometry in characterization of fluids K Hassani, SM Shiva Applied Optics 60 (36), 11027-11033, 2021 | 3 | 2021 |
| Simulation of the Ronchi test for arbitrary wave aberrations in imaging systems K Hassani European Journal of Physics 42 (2), 025301, 2021 | 2 | 2021 |
| In-plane deformation gradient measurement using common-path spatial phase shift shearography H Hooshmand-Ziafi, K Hassani, M Dashtdar Optical Methods for Inspection, Characterization, and Imaging of …, 2019 | 2 | 2019 |
| Digital speckle shearography setup to measure the field-induced strain map in piezoelectric materials H Hooshmand-Ziafi, K Hassani, M Motallebi-Araghi, M Dashtdar Review of Scientific Instruments 91 (11), 2020 | 1 | 2020 |
Mohammad Taghi TavassolyProfessor of Physics at the University of Tehran在 iasbs.ac.ir 的电子邮件经过验证
