| Anomaly detection and automatic labeling for solar cell quality inspection based on generative adversarial network J Balzategui, L Eciolaza, D Maestro-Watson Sensors 21 (13), 4361, 2021 | 33 | 2021 |
| Deep learning for deflectometric inspection of specular surfaces D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba International Joint Conference SOCO’18-CISIS’18-ICEUTE’18: San Sebastián …, 2019 | 14 | 2019 |
| Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba Journal of Electronic Imaging 29 (4), 041007-041007, 2020 | 9 | 2020 |
| Deflectometric data segmentation based on fully convolutional neural networks D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba Fourteenth International Conference on Quality Control by Artificial Vision …, 2019 | 7 | 2019 |
| LCD screen calibration for deflectometric systems considering a single layer refraction model D Maestro-Watson, A Izaguirre, N Arana-Arexolaleiba 2017 IEEE International Workshop of Electronics, Control, Measurement …, 2017 | 7 | 2017 |
| Depth Data Denoising in Optical Laser Based Sensors for Metal Sheet Flatness Measurement: A Deep Learning Approach M Alonso, D Maestro, A Izaguirre, I Andonegui, M Graña Sensors 21 (21), 7024, 2021 | 3 | 2021 |
| Depth Data Denoising in Optical Laser Based Sensors for Metal Sheet Flatness Measurement: A Deep Learning Approach M Alonso Nieto, D Maestro, A Izaguirre, I Andonegui, MM Graña Romay MDPI, 2021 | | 2021 |
| 3D inspection methods for specular or partially specular surfaces D Maestro-Watson Mondragon Unibertsitatea. Goi Eskola Politeknikoa, 2020 | | 2020 |
| A simple deflectometric method for measurement of Quasi-Plane specular surfaces D Maestro-Watson, A Izaguirre, N Arana-Arexolaleiba, A Iturrospe 2015 IEEE International Workshop of Electronics, Control, Measurement …, 2015 | | 2015 |
Luka Eciolaza EcheverriaMondragon University在 mondragon.edu 的电子邮件经过验证
