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Alexander Sheldon
Alexander Sheldon
在 nxp.com 的电子邮件经过验证
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引用次数
引用次数
年份
Cryogenic Noise-Parameter Measurements: Recent Research and a Fully Automated Measurement Application
A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick
IEEE Microwave Magazine 22 (8), 52-64, 2021
122021
Impact of Noise Bandwidth on Noise Figure
A Sheldon, L Belostotski, G Messier, A Madanayake
IEEE Transactions on Instrumentation and Measurement 68 (7), 2662-2664, 2019
82019
A Cryo-CMOS Low-Noise Amplifier With 2.3-to-8.5-K Noise Temperature at 20 K for Highly Integrated Radio-Astronomy Receivers
A Sheldon, L Belostotski
IEEE Microwave and Wireless Components Letters 32 (11), 1319-1322, 2022
72022
Delay-Tunable Compact RC-Only All-Pass Filter
MB Elamien, A Sheldon, BJ Maundy, L Belostotski, AS Elwakil
IEEE Microwave and Wireless Components Letters 31 (5), 461-464, 2021
42021
Early results on energetic particle precipitation observed by the ABOVE instrument array
CM Cully, D Chaddock, C Daniel, E Davis, D Galts, N McGuffin, C Quinn, ...
AGU Fall Meeting Abstracts 2014, SA13B-3997, 2014
42014
Automated noise-parameter measurements of cryogenic LNAs
A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick
2021 97th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2021
22021
Cryo-CMOS Low-Noise Amplifier for the Square Kilometre Array
A Sheldon, L Belostotski
2018 18th International Symposium on Antenna Technology and Applied …, 2018
22018
Noise-Parameter Measurements of Very-Low-Noise Amplifiers at Ambient and Cryogenic Temperatures
A Sheldon, L Belostotski
IEEE Instrumentation & Measurement Magazine 24 (2), 79-83, 2021
2021
Dr. Ali Sheikholeslami's Circuit Intuitions Lecture at the University of Calgary [Chapters]
A Sheldon, L Belostotski
IEEE Solid-State Circuits Magazine 12 (2), 72-72, 2020
2020
Gamma Ray and Very Low Frequency Radio Observations from a Balloon-Borne Platform
C Quinn, A Sheldon, CM Cully, A Davalos, C Osakwe, D Galts, J Delfin, ...
AGU Fall Meeting Abstracts 2015, AE33A-0469, 2015
2015
Review of Cryogenic Noise-Parameter Measurements and an Application Example
A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick
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