关注
Pouya Tavousi
Pouya Tavousi
在 uconn.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Tumor Control Index as a new tool to assess tumor growth in experimental animals
WL Corwin, H Ebrahimi-Nik, SM Floyd, P Tavousi, II Mandoiu, ...
Journal of immunological methods 445, 71-76, 2017
272017
Protofold ii: Enhanced model and implementation for kinetostatic protein folding
P Tavousi, M Behandish, HT Ilieş, K Kazerounian
Journal of Nanotechnology in Engineering and Medicine 6 (3), 034601, 2015
212015
Training AI-based feature extraction algorithms, for micro CT images, using synthesized data
M Konnik, B Ahmadi, N May, J Favata, Z Shahbazi, S Shahbazmohamadi, ...
Journal of Nondestructive Evaluation 40, 1-13, 2021
182021
Synthesizing Functional Mechanisms From a Link Soup
P Tavousi, K Kazerounian, H Ilies
ASME 2015 International Design Engineering Technical Conferences and …, 2015
112015
Assemble-and-match: A novel hybrid tool for enhancing education and research in rational structure based drug design
P Tavousi, R Amin, S Shahbazmohamadi
Scientific reports 8 (1), 849, 2018
102018
Rapid high-resolution volumetric imaging via laser ablation delayering and confocal imaging
A Phoulady, N May, H Choi, Y Suleiman, S Shahbazmohamadi, ...
Scientific Reports 12 (1), 12277, 2022
72022
Gas-assisted femtosecond pulsed laser machining: A high-throughput alternative to focused ion beam for creating large, high-resolution cross sections
N May, H Choi, A Phoulady, S Amini, P Tavousi, S Shahbazmohamadi
Plos one 18 (5), e0285158, 2023
62023
Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy
H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ...
Microelectronics Reliability 138, 114659, 2022
62022
Femtosecond laser hierarchical surface restructuring for next generation neural interfacing electrodes and microelectrode arrays
S Amini, W Seche, N May, H Choi, P Tavousi, S Shahbazmohamadi
Scientific Reports 12 (1), 13966, 2022
62022
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
A Phoulady, N May, H Choi, S Shahbazmohamadi, P Tavousi
Microelectronics Reliability 126, 114287, 2021
62021
GPU-accelerated computation of solvation free energy for kinetostatic protein folding simulation
M Behandish, P Tavousi, HT Ilieş, K Kazerounian
International Design Engineering Technical Conferences and Computers and …, 2013
62013
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation
N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ...
Microelectronics Reliability 138, 114660, 2022
52022
Single image composite tomography utilizing large scale femtosecond laser cross-sectioning and scanning electron microscopy
N May, A Phoulady, H Choi, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 876-878, 2022
52022
Kinematic design of functional nanoscale mechanisms from molecular primitives
MT Chorsi, P Tavousi, C Mundrane, V Gorbatyuk, K Kazerounian, H Ilies
Journal of Micro-and Nano-Manufacturing 9 (2), 021005, 2021
5*2021
On the systematic design and analysis of artificial molecular machines
P Tavousi
52016
Terahertz-readable laser engraved marks as a novel solution for product traceability
P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi
Scientific Reports 13 (1), 12474, 2023
42023
Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography
N May, H Choi, A Phoulady, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 284-286, 2022
42022
Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
N May, J Favata, B Ahmadi, P Tavousi, S Shahbazmohamadi
Microelectronics Reliability 114, 113858, 2020
42020
A novel crowdsourcing platform for microelectronics counterfeit defect detection
B Ahmadi, P Tavousi, J Favata, P Shahbeigi-Roodposhti, R Pelapur, ...
Microelectronics Reliability 88, 48-53, 2018
42018
Synthetic data augmentation to enhance manual and automated defect detection in microelectronics
A Phoulady, Y Suleiman, H Choi, T Moore, N May, S Shahbazmohamadi, ...
Microelectronics Reliability 150, 115220, 2023
32023
系统目前无法执行此操作,请稍后再试。
文章 1–20