关注
Lu Bin
Lu Bin
Shanxi Normal University
在 sxnu.edu.cn 的电子邮件经过验证
标题
引用次数
引用次数
年份
A charge-based capacitance model for double-gate tunnel FETs with closed-form solution
B Lu, H Lu, Y Zhang, Y Zhang, X Cui, Z Lv, S Yang, C Liu
IEEE Transactions on Electron Devices 65 (1), 299-307, 2017
302017
Fully analytical carrier-based charge and capacitance model for hetero-gate-dielectric tunneling field-effect transistors
B Lu, H Lu, Y Zhang, Y Zhang, X Cui, Z Lv, C Liu
IEEE Transactions on Electron Devices 65 (8), 3555-3561, 2018
212018
A novel planar architecture for heterojunction TFETs with improved performance and its digital application as an inverter
S Yang, H Lv, B Lu, S Yan, Y Zhang
IEEE Access 8, 23559-23567, 2020
172020
A fully analytical current model for tunnel field-effect transistors considering the effects of source depletion and channel charges
Z Lyu, H Lu, Y Zhang, Y Zhang, B Lu, X Cui, Y Zhao
IEEE Transactions on Electron Devices 65 (11), 4988-4994, 2018
162018
A novel high-performance planar InAs/GaSb face-tunneling FET with implanted drain for leakage current reduction
Z Lyu, H Lv, Y Zhang, Y Zhang, Y Zhu, J Sun, M Li, B Lu
IEEE Transactions on Electron Devices 68 (3), 1313-1317, 2021
152021
Characteristics of InAs/GaSb line-tunneling FETs with buried drain technique
B Lu, Y Cui, A Guo, D Wang, Z Lv, J Zhou, Y Miao
IEEE Transactions on Electron Devices 68 (4), 1537-1541, 2021
132021
A Compact Model for Nanowire Tunneling-FETs
B Lu, D Wang, Y Cui, Z Li, G Chai, L Dong, J Zhou, G Wang, Y Miao, Z Lv, ...
IEEE Transactions on Electron Devices 69 (1), 419-426, 2021
102021
A non-quasi-static model for tunneling FETs based on the relaxation time approximation
B Lu, Z Lv, H Lu, Y Cui
IEEE Electron Device Letters 40 (12), 1996-1999, 2019
82019
A Fully Analytical Current Model for Gate–Source Overlap Tunneling FETs as the Ternary Devices
Z Lyu, H Lu, C Liu, Y Zhang, Y Zhang, Y Zhu, J Sun, B Lu, Z Jia, M Zhao
IEEE Transactions on Electron Devices 69 (10), 5900-5905, 2022
52022
系统目前无法执行此操作,请稍后再试。
文章 1–9