HEIMDALL: an AI-based infrastructure for traffic monitoring and anomalies detection A Atzori, S Barra, S Carta, G Fenu, AS Podda 2021 IEEE International Conference on Pervasive Computing and Communications …, 2021 | 16 | 2021 |
Explaining bias in deep face recognition via image characteristics A Atzori, G Fenu, M Marras 2022 IEEE International Joint Conference on Biometrics (IJCB), 1-10, 2022 | 14 | 2022 |
Demographic bias in low-resolution deep face recognition in the wild A Atzori, G Fenu, M Marras IEEE Journal of Selected Topics in Signal Processing 17 (3), 599-611, 2023 | 11 | 2023 |
FRCSyn-onGoing: Benchmarking and comprehensive evaluation of real and synthetic data to improve face recognition systems P Melzi, R Tolosana, R Vera-Rodriguez, M Kim, C Rathgeb, X Liu, ... Information Fusion 107, 102322, 2024 | 7 | 2024 |
FRCSyn challenge at WACV 2024: Face recognition challenge in the era of synthetic data P Melzi, R Tolosana, R Vera-Rodriguez, M Kim, C Rathgeb, X Liu, ... Proceedings of the IEEE/CVF Winter Conference on Applications of Computer …, 2024 | 6 | 2024 |
The More Secure, The Less Equally Usable: Gender and Ethnicity (Un) fairness of Deep Face Recognition along Security Thresholds A Atzori, G Fenu, M Marras The 13th International Conference on Emerging Ubiquitous Systems and …, 2022 | 4 | 2022 |
Frcsyn challenge at cvpr 2024: Face recognition challenge in the era of synthetic data I DeAndres-Tame, R Tolosana, P Melzi, R Vera-Rodriguez, M Kim, ... Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024 | 2 | 2024 |
If It's Not Enough, Make It So: Reducing Authentic Data Demand in Face Recognition through Synthetic Faces A Atzori, F Boutros, N Damer, G Fenu, M Marras arXiv preprint arXiv:2404.03537, 2024 | 1 | 2024 |
Fairness of Exposure in Forensic Face Rankings A Atzori, G Fenu, M Marras 13th Italian Information Retrieval Workshop 3448, 2023 | 1 | 2023 |
(Un) fair Exposure in Deep Face Rankings at a Distance A Atzori, G Fenu, M Marras 2023 IEEE International Joint Conference on Biometrics (IJCB), 1-9, 2023 | | 2023 |