| Silver clusters embedded in glass as a perennial high capacity optical recording medium A Royon, K Bourhis, M Bellec, G Papon, B Bousquet, Y Deshayes, ... Advanced materials 22 (46), 5282-5286, 2010 | 250 | 2010 |
| Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests Y Deshayes, L Bechou, F Verdier, Y Danto Quality and Reliability Engineering International 21 (6), 571-594, 2005 | 48 | 2005 |
| Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses R Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ... Microelectronics reliability 50 (9-11), 1568-1573, 2010 | 30 | 2010 |
| Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations Y Deshayes, F Verdier, L Bechou, B Tregon, Y Danto, D Laffitte, ... Reliability of Optical Fiber Components, Devices, Systems, and Networks II …, 2004 | 22 | 2004 |
| Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements Y Deshayes, L Bechou, L Mendizabal, Y Danto Measurement 34 (2), 157-178, 2003 | 21 | 2003 |
| Miniaturization of InGaP/InGaAs/Ge solar cells for micro‐concentrator photovoltaics P Albert, A Jaouad, G Hamon, M Volatier, CE Valdivia, Y Deshayes, ... Progress in Photovoltaics: Research and Applications 29 (9), 990-999, 2021 | 19 | 2021 |
| Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties L Bechou, O Rehioui, Y Deshayes, O Gilard, G Quadri, Y Ousten Optics & Laser Technology 40 (4), 589-601, 2008 | 19 | 2008 |
| Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy A Royon, K Bourhis, L Béchou, T Cardinal, L Canioni, Y Deshayes Microelectronics Reliability 53 (9-11), 1514-1518, 2013 | 17 | 2013 |
| Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm Laser modules Y Deshayes, L Bechou, JY Delétage, F Verdier, Y Danto, D Laffitte, ... Microelectronics Reliability 43 (7), 1125-1136, 2003 | 17 | 2003 |
| Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications ML Bourqui, L Béchou, O Gilard, Y Deshayes, P Del Vecchio, LS How, ... Microelectronics Reliability 48 (8-9), 1202-1207, 2008 | 16 | 2008 |
| Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations JY Delétage, FJM Verdier, B Plano, Y Deshayes, L Bechou, Y Danto Microelectronics Reliability 43 (7), 1137-1144, 2003 | 16 | 2003 |
| Proton effects on low noise and high responsivity silicon-based photodiodes for space environment G Pedroza, O Gilard, ML Bourqui, L Bechou, Y Deshayes, LS How, ... Journal of applied physics 105 (2), 2009 | 15 | 2009 |
| Reliability Investigation of LED Devices for Public Light Applications R Baillot, Y Deshayes Elsevier, 2017 | 13 | 2017 |
| High-power diode laser bars and shear strain DT Cassidy, O Rehioui, CK Hall, L Béchou, Y Deshayes, A Kohl, ... Optics letters 38 (10), 1633-1635, 2013 | 13 | 2013 |
| Tools and analysis methods of encapsulated LEDs R Baillot, Y Deshayes Reliability Investigation of LED Devices for Public Light Applications, 43-106, 2017 | 9 | 2017 |
| Examination of femtosecond laser matter interaction in multipulse regime for surface nanopatterning of vitreous substrates N Varkentina, T Cardinal, F Moroté, P Mounaix, P André, Y Deshayes, ... Optics Express 21 (24), 29090-29100, 2013 | 8 | 2013 |
| Study of influence of failure modes on lifetime distribution prediction of 1.55 pum DFB Laser diodes using weak drift of monitored parameters during ageing tests L. Mendizabal … D Laffitte, JL Goudard, F Houé Microelectronics Reliability 44, 1337-1342, 2004 | 8 | 2004 |
| Overview on sustainability, robustness, and reliability of GaN single-chip LED devices Y Deshayes, R Baillot, S Joly, Y Ousten, L Béchou IEEE Transactions on Device and Materials Reliability 15 (4), 621-625, 2015 | 7 | 2015 |
| Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation Y Deshayes, I Bord, G Barreau, M Aiche, PH Moretto, L Béchou, ... Microelectronics Reliability 48 (8-9), 1354-1360, 2008 | 7 | 2008 |
| Practical optical gain by an extended Hakki-Paoli method M Vanzi, G Marcello, G Mura, G Le Gales, S Joly, Y Deshayes, L Bechou Microelectronics Reliability 76, 579-583, 2017 | 6 | 2017 |
Lionel CanioniUniversite Bordeaux在 u-bordeaux.fr 的电子邮件经过验证
