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Lukas Valdman
Lukas Valdman
Reliability Engineer at Infineon Technologies
在 vscht.cz 的电子邮件经过验证
标题
引用次数
引用次数
年份
All‐solution‐processed van der waals heterostructures for wafer‐scale electronics
J Kim, D Rhee, O Song, M Kim, YH Kwon, DU Lim, IS Kim, V Mazánek, ...
Advanced Materials 34 (12), 2106110, 2022
692022
High-Crystallinity Epitaxial Sb2Se3 Thin Films on Mica for Flexible Near-Infrared Photodetectors
X Wen, Z Lu, L Valdman, GC Wang, M Washington, TM Lu
ACS applied materials & interfaces 12 (31), 35222-35231, 2020
582020
Monolayer MoS2 on sapphire: an azimuthal reflection high-energy electron diffraction perspective
Y Xiang, X Sun, L Valdman, F Zhang, TH Choudhury, M Chubarov, ...
2D Materials 8 (2), 025003, 2020
292020
Ambient-Stable Two-Dimensional CrI3 via Organic-Inorganic Encapsulation
JT Gish, D Lebedev, TK Stanev, S Jiang, L Georgopoulos, TW Song, ...
ACS nano 15 (6), 10659-10667, 2021
282021
Layered ZnIn2S4 Single Crystals for Ultrasensitive and Wearable Photodetectors
L Valdman, V Mazánek, P Marvan, M Serra, R Arenal, Z Sofer
Advanced Optical Materials 9 (21), 2100845, 2021
222021
InSe: Ge-doped InSe van der Waals heterostructure to enhance photogenerated carrier separation for self-powered photoelectrochemical-type photodetectors
L Liao, B Wu, E Kovalska, FM Oliveira, J Azadmanjiri, V Mazánek, ...
Nanoscale 14 (14), 5412-5424, 2022
142022
Surface and interface structures of epitaxial Sb2Se3 on mica
L Valdman, X Wen, Z Lu, X Chen, F Hiebel, L Zhang, K Kisslinger, Y Tao, ...
Applied Surface Science 567, 150859, 2021
82021
Water-assisted exfoliation of epitaxial CdTe film from mica analyzed with azimuthal RHEED
L Valdman, X Wen, Z Chen, M Washington, TM Lu, J Shi, GC Wang
Applied Surface Science 536, 147886, 2021
52021
Anomaly of NBTI data for PMOS transistors degraded by plasma processing induced charging damage (PID)
A Martin, L Valdman, BH Stafford, H Nielen
2022 IEEE International Integrated Reliability Workshop (IIRW), 1-6, 2022
42022
Unraveling the Mechanism of the Persistent Photoconductivity in InSe and its Doped Counterparts
L Liao, E Kovalska, J Luxa, L Dekanovsky, V Mazanek, L Valdman, B Wu, ...
Advanced Optical Materials 10 (20), 2200522, 2022
42022
Layered selenophosphate HgPSe 3 single crystals: a new candidate for X-ray to visible light photodetectors
L Liao, E Kovalska, V Mazanek, L Valdman, L Dekanovsky, W Bing, ...
Journal of Materials Chemistry C 10 (22), 8834-8844, 2022
42022
Improving conductivity in carbon nanotube percolating networks through inclusion of Laponite nanoparticles
L Valdman, D Dobbs, R Cortez, ME Hagerman
Materials Letters 217, 88-91, 2018
42018
Germanane and (3‐Hydroxypropyl) germanane as Single Crystal Photodetectors
T Hartman, L Valdman, J Šturala, KJ Sarkar, FM Oliveira, Z Sofer
Advanced Optical Materials 11 (16), 2300288, 2023
12023
Plasma induced charging damage causing MOS device reliability lifetime degradation originating from well charging of a technology with deep trench isolation
A Martin, J Berger, A Kamp, L Valdman, A Lehner, S Mykytenko, H Nielen
IEEE Transactions on Device and Materials Reliability 23 (3), 317-327, 2023
12023
Analýza napjatosti nalisovaného spoje využívajícího dutý hřídel
L Valdman
České vysoké učení technické v Praze. Vypočetní a informační centrum., 2018
12018
All‐Solution‐Processed Van der Waals Heterostructures for Wafer‐Scale Electronics (Adv. Mater. 12/2022)
J Kim, D Rhee, O Song, M Kim, YH Kwon, DU Lim, IS Kim, V Mazánek, ...
Advanced Materials 34 (12), 2270096, 2022
2022
Ambient-Stable Two-Dimensional CrI3 via Organic-Inorganic Encapsulation
D Lebedev, T Gish, T Stanev, S Jiang, L Georgopoulos, T Song, G Lim, ...
APS March Meeting Abstracts 2022, T53. 013, 2022
2022
Construction of Moke Microscope for Magnetic Studies of Vanadium Disulfide Flakes
L Valdman
Rensselaer Polytechnic Institute, 2020
2020
Morphology and conductivity studies of laponite/single-walled carbon nanotube nanonetworks
M Hagerman, R Cortez, L Valdman, D Dobbs
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 256, 2018
2018
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