| Development of a new approach for low-laser-power super-resolution fluorescence imaging J Chung, U Jeong, D Jeong, S Go, D Kim Analytical Chemistry 94 (2), 618-627, 2021 | 15 | 2021 |
| Polarity nano-mapping of polymer film using spectrally resolved super-resolution imaging Y Park, D Jeong, U Jeong, H Park, S Yoon, M Kang, D Kim ACS Applied Materials & Interfaces 14 (40), 46032-46042, 2022 | 13 | 2022 |
| Super-resolution fluorescence imaging for semiconductor nanoscale metrology and inspection DT Nguyen, S Mun, HB Park, U Jeong, G Kim, S Lee, CS Jun, MM Sung, ... Nano Letters 22 (24), 10080-10087, 2022 | 9 | 2022 |
| Development of highly dense material-specific fluorophore labeling method on silicon-based semiconductor materials for three-dimensional multicolor super-resolution … U Jeong, D Jeong, S Go, H Park, G Kim, N Kim, J Jung, W Kim, M Lee, ... Chemistry of Materials 35 (14), 5572-5581, 2023 | 5 | 2023 |
| Bacteria detection and species identification at the single-cell level using super-resolution fluorescence imaging and AI analysis MJ Kim, J Park, M Kang, U Jeong, D Jeong, NG Kang, SJ Hwang, ... Biosensors and Bioelectronics 240, 115603, 2023 | 3 | 2023 |
| Edge roughness analysis in nanoscale for single-molecule localization microscopy images U Jeong, G Go, D Jeong, D Lee, MJ Kim, M Kang, N Kim, J Jung, W Kim, ... Nanophotonics 13 (2), 195-207, 2024 | 2 | 2024 |
| Photoswitching Reagent for Super‐Resolution Fluorescence Microscopy G Go, U Jeong, H Park, S Go, D Kim Angewandte Chemie International Edition, e202405246, 2024 | 1 | 2024 |
| Nanoscale single-vesicle analysis: High-throughput approaches through AI-enhanced super-resolution image analysis HJ Lim, GW Kim, GH Heo, U Jeong, MJ Kim, D Jeong, Y Hyun, D Kim Biosensors and Bioelectronics 263, 116629, 2024 | | 2024 |
| Innenrücktitelbild: Photoswitching Reagent for Super‐Resolution Fluorescence Microscopy (Angew. Chem. 27/2024) G Go, U Jeong, H Park, S Go, D Kim Angewandte Chemie 136 (27), e202410121, 2024 | | 2024 |
| Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology system KIM Namyoon, KIM Doory, W Kim, M Lee, J Jung, C Choi, D Jeong, ... US Patent App. 18/528,206, 2024 | | 2024 |
| Method for fabricating a semiconductor device KIM Doory, JH Jung, WR Kim, NY Kim, MJ Lee, GO SeokRan, D Jeong, ... US Patent App. 17/874,450, 2023 | | 2023 |
