| The effect of a deep virtual guard ring on the device characteristics of silicon single photon avalanche diodes D Shin, B Park, Y Chae, I Yun IEEE Transactions on Electron Devices 66 (7), 2986-2991, 2019 | 33 | 2019 |
| Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays MS Bae, C Park, D Shin, SM Lee, I Yun Solid-State Electronics 133, 1-5, 2017 | 21 | 2017 |
| Degradation mechanisms of amorphous InGaZnO thin-film transistors used in foldable displays by dynamic mechanical stress SM Lee, D Shin, I Yun IEEE Transactions on Electron Devices 64 (1), 170-175, 2016 | 19 | 2016 |
| Instability of oxide thin film transistor under electrical–mechanical hybrid stress for foldable display D Shin, MS Bae, I Yun Microelectronics Reliability 64, 109-112, 2016 | 12 | 2016 |
| Structure variation effects on device reliability of single photon avalanche diodes D Shin, B Park, Y Chae, I Yun Microelectronics Reliability 76, 610-613, 2017 | 6 | 2017 |
| Real-time plasma uniformity monitoring via selective plasma light intensity measurement using transparent-LCD-module-adapted optical emission spectroscopy IJ Kim, C Park, D Shin, I Yun IEEE Sensors Journal 21 (2), 2256-2262, 2020 | 5 | 2020 |
| Effect of SiOx/SiNx stacked gate dielectric structure on the instability of a-IGZO thin film transistors D Shin, EN Cho, S Park, I Yun ECS Transactions 60 (1), 951, 2014 | 4 | 2014 |
| Junction Design Guideline of Silicon Single-Photon Avalanche Diodes for Edge Breakdown Suppression H Lee, D Shin, H Choi, I Yun 2022 IEEE Photonics Conference (IPC), 1-2, 2022 | 1 | 2022 |
| Model-based guard ring structure guideline for the enhancement of silicon-based single-photon avalanche diode characteristics D Shin, B Park, Y Chae, I Yun Silicon Photonics XV 11285, 256-261, 2020 | 1 | 2020 |
| Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement SM Lee, D Shin, I Yun 2016 International Conference on Electronics Packaging (ICEP), 145-148, 2016 | 1 | 2016 |
| Effect of process parameters on hard coating film characteristics in roll-to-roll printing process system D Shin, SM Lee, I Yun 2016 International Conference on Electronics Packaging (ICEP), 141-144, 2016 | 1 | 2016 |
| Modeling and simulation of flexible oxide thin film transistors D Shin, SM Lee, I Yun International Electron Devices and Materials Symposia (IEDMS), 2014 | 1 | 2014 |
| Design risk for fabrication stability of silicon single-photon avalanche diodes with deep N-well implantation H Lee, D Shin, H Choi, I Yun Physics and Simulation of Optoelectronic Devices XXXI 12415, 54-60, 2023 | | 2023 |
| Size Effect of Deep Virtual Guard Ring on the Characteristic of Silicon Single Photon Avalanche Diodes D Shin, H Choi, B Park, Y Chae, I Yun | | |
| Effect of different guard ring structures on electrical and thermal characteristics of single photon avalanche diodes Y Jee, D Shin, B Park, Y Chae, I Yun | | |
| Degradation behaviour of LTPS thin film transistors by static mechanical stresses with different folding directions MS Bae, D Shin, I Yun | | |
| The Experiment Observation of Cyclic Bending Stress on Flexible a-IGZO TFT with Various Bending Radius SM Lee, D Shin, I Yun | | |
Ilgu YunProfessor, School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea在 yonsei.ac.kr 的电子邮件经过验证
