Self-scalable tanh (stan): Multi-scale solutions for physics-informed neural networks R Gnanasambandam, B Shen, J Chung, X Yue, Z Kong IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023 | 15* | 2023 |
Crime risk maps: A multivariate spatial analysis of crime data J Chung, H Kim Geographical analysis 51 (4), 475-499, 2019 | 15 | 2019 |
Reinforcement Learning-based Defect Mitigation for Quality Assurance of Additive Manufacturing J Chung, B Shen, ACC Law, Z Kong Journal of Manufacturing Systems, 2022 | 14 | 2022 |
Anomaly Detection in Additive Manufacturing Processes using Supervised Classification with Imbalanced Sensor Data based on Generative Adversarial Network J Chung, B Shen, Z Kong Journal of Intelligent Manufacturing, 2023 | 12* | 2023 |
Process parameter optimization for reproducible fabrication of layer porosity quality of 3D-printed tissue scaffold ACC Law, R Wang, J Chung, E Kucukdeger, Y Liu, T Barron, BN Johnson, ... Journal of Intelligent Manufacturing 35 (4), 1825-1844, 2024 | 3 | 2024 |
On Model Compression for Neural Networks: Framework, Algorithm, and Convergence Guarantee C Li, J Chung, B Cai, H Wang, X Zhou, B Shen arXiv preprint arXiv:2303.06815, 2024 | 2 | 2024 |
A Novel Sparse Bayesian Learning and Its Application to Fault Diagnosis for Multistation Assembly Systems J Chung, B Shen, Z Kong IISE Transactions, 2023 | 2 | 2023 |
Imbalanced spectral data analysis using data augmentation based on the generative adversarial network J Chung, J Zhang, AI Saimon, Y Liu, BN Johnson, Z Kong Scientific Reports 14 (1), 13230, 2024 | | 2024 |
Predicting the stereoselectivity of chemical reactions by composite machine learning method J Chung, J Li, AI Saimon, P Hong, Z Kong Scientific reports 14 (1), 12131, 2024 | | 2024 |
Ensuring Additive Manufacturing Quality and Cyber-Physical Security via Side-Channel Measurements and Transmissions N Raeker-Jordan, J Chung, ZJ Kong, CB Williams Journal of Manufacturing Systems, 2024 | | 2024 |
A Sparse Bayesian Learning for Diagnosis of Nonstationary and Spatially Correlated Faults with Application to Multistation Assembly Systems J Chung, Z Kong arXiv preprint arXiv:2310.16058, 2023 | | 2023 |
Process Monitoring and Control of Advanced Manufacturing based on Physics-Assisted Machine Learning J Chung Virginia Tech, 2023 | | 2023 |
Automatic Thresholding by Reconstruction Error in Unsupervised Anomaly Detection J Chung, R Gnanasambandam, ZJ Kong IISE Annual Conference and Expo, 2023 | | 2023 |