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Noel O’Toole
Noel O’Toole
Kurt J Lesker Company
在 kjlc.com 的电子邮件经过验证
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Tutorial on interpreting x-ray photoelectron spectroscopy survey spectra: Questions and answers on spectra from the atomic layer deposition of Al2O3 on silicon
D Shah, DI Patel, T Roychowdhury, GB Rayner, N O’Toole, DR Baer, ...
Journal of Vacuum Science & Technology B 36 (6), 2018
732018
Ultrahigh purity conditions for nitride growth with low oxygen content by plasma-enhanced atomic layer deposition
GB Rayner, N O’Toole, J Shallenberger, B Johs
Journal of Vacuum Science & Technology A 38 (6), 2020
182020
Ultra high purity conditions for atomic scale processing
GB Rayner, NC O'toole, DE Carlsen
US Patent 11,631,571, 2023
12023
Ultrahigh purity plasma-enhanced atomic layer deposition and electrical properties of epitaxial scandium nitride
GB Rayner, N O’Toole, B Liu, J Shallenberger, J Zhu, T Palacios, ...
Journal of Vacuum Science & Technology A 43 (2), 2025
2025
Ultra High Purity Conditions for Atomic Scale Processing
GB Rayner, NC O'toole, DE Carlsen
US Patent App. 18/178,664, 2023
2023
Pressure-Induced Temperature Modification During Atomic Scale Processing
GB Rayner, NC O'toole, TJ Larrabee
US Patent App. 17/679,448, 2022
2022
Plasma Enhanced Atomic Layer Deposition of High Purity Titanium Nitride: Comparison of Hollow Cathode and Inductively Coupled Discharges
S Woodward, O Zabieda, L Martinu, B Rayner, N O’Toole, KSA Butcher
Proceedings of the 2018 Technical Conference Proceedings Emerging …, 2018
2018
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