Self-learning tuning for post-silicon validation P Domanski, D Pflüger, J Rivoir, R Latty arXiv preprint arXiv:2111.08995, 2021 | 9 | 2021 |
Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
Orsa: Outlier robust stacked aggregation for best-and worst-case approximations of ensemble systems P Domanski, D Pflüger, R Latty, J Rivoir 2021 20th IEEE International Conference on Machine Learning and Applications …, 2021 | 5 | 2021 |
Blood Glucose Prediction for Type-1 Diabetics using Deep Reinforcement Learning P Domanski, A Ray, F Firouzi, K Lafata, K Chakrabarty, D Pflüger 2023 IEEE International Conference on Digital Health (ICDH), 339-347, 2023 | 1 | 2023 |
ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects X Tan, P Domanski, S Banerjee, K Chakrabarty Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning …, 2024 | | 2024 |
Advancing blood glucose prediction with neural architecture search and deep reinforcement learning for type 1 diabetics P Domanski, A Ray, K Lafata, F Firouzi, K Chakrabarty, D Pflüger Biocybernetics and Biomedical Engineering 44 (3), 481-500, 2024 | | 2024 |
High-Fidelity Simulation of a Cartpole for Sim-to-Real Deep Reinforcement Learning L Bantel, P Domanski, D Pflüger 2024 4th Interdisciplinary Conference on Electrics and Computer (INTCEC), 1-6, 2024 | | 2024 |
Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties D Schwachhofer, P Domanski, S Becker, S Wagner, M Sauer, D Pflüger, ... 2024 IEEE European Test Symposium (ETS), 1-4, 2024 | | 2024 |
Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties D Schwachhofer, P Domanski, S Becker, S Wagner, M Sauer, D Pflüger, ... arXiv preprint arXiv:2403.10086, 2024 | | 2024 |
Learn to Tune: Robust Performance Tuning in Post-Silicon Validation P Domanski, D Pflüger, R Latty 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | | 2023 |