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Juefei Yang
Juefei Yang
在 bristol.ac.uk 的电子邮件经过验证
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引用次数
引用次数
年份
Analysis of the 1st and 3rd quadrant transients of symmetrical and asymmetrical double-trench SiC power MOSFETs
J Yang, S Jahdi, B Stark, O Alatise, J Ortiz-Gonzalez, P Mellor
IEEE Open Journal of Power Electronics 2, 265-276, 2021
132021
Crosstalk induced shoot-through in bti-stressed symmetrical & asymmetrical double-trench sic power mosfets
J Yang, S Jahdi, B Stark, O Alatise, J Ortiz-Gonzalez, R Wu, P Mellor
IEEE Open Journal of the Industrial Electronics Society 3, 188-202, 2022
122022
Degradation analysis of planar, symmetrical and asymmetrical trench SiC MOSFETs under repetitive short circuit impulses
R Yu, S Jahdi, P Mellor, L Liu, J Yang, C Shen, O Alatise, J Ortiz-Gonzalez
IEEE Transactions on Power Electronics, 2023
102023
Impact of temperature and switching rate on properties of crosstalk on symmetrical & asymmetrical double-trench sic power mosfet
J Yang, S Jahdi, B Stark, R Wu, O Alatise, JO Gonzalez
IECON 2021–47th Annual Conference of the IEEE Industrial Electronics Society …, 2021
82021
Investigation of performance of double-trench SiC power MOSFETs in forward and reverse quadrant operation
J Yang, S Jahdi, B Stark, P Mellor, O Alatise, J Ortiz-Gonzalez
PCIM Europe digital days 2021; International Exhibition and Conference for …, 2021
72021
Impact of temperature and switching rate on forward and reverse conduction of gan and sic cascode devices: A technology evaluation
Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, M Hedayati, B Stark, J Yang, ...
IET Digital Library, 2021
62021
Threshold voltage drift and on-resistance of sic symmetrical and asymmetrical double-trench mosfets under gate bias stress
J Yang, S Jahdi, B Stark, P Mellor, R Wu, J Ortiz-Gonzalez, O Alatise
PCIM Europe 2022; International Exhibition and Conference for Power …, 2022
52022
Impact of carriers injection level on transients of discrete and paralleled silicon and 4h-sic npn bjts
C Shen, S Jahdi, J Yang, O Alatise, J Ortiz-Gonzalez, R Wu, P Mellor
IEEE Open Journal of the Industrial Electronics Society 3, 65-80, 2022
52022
Investigation of repetitive short circuit stress as a degradation metric in symmetrical and asymmetrical double-trench sic power mosfets
R Yu, S Jahdi, P Mellor, J Yang, C Shen, L Liu, O Alatise, J Ortiz-Gonzalez
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022
42022
Analysis of on-state static and dynamic transients of high voltage 4H-SIC Merged-PiN-Schottky diode
C Shen, S Jahdi, P Mellor, J Yang, E Bashar, O Alatise, J Ortiz-Gonzalez
IET Digital Library, 2022
22022
Electrothermal ruggedness of high voltage sic merged-pin-schottky diodes under inductive avalanche & surge current stress
C Shen, S Jahdi, J Yang, O Alatise, J Ortiz-Gonzalez, P Mellor
2022 IEEE Energy Conversion Congress and Exposition (ECCE), 1-7, 2022
12022
Positive and negative bias temperature instability on crosstalk-stressed symmetrical & asymmetrical double-trench sic mosfets
J Yang, S Jahdi, B Stark, C Shen, O Alatise, J Ortiz-Gonzalez, P Mellor
2022 IEEE Energy Conversion Congress and Exposition (ECCE), 1-7, 2022
12022
Impact of Electrothermal Bias Temperature Instability Stress on Threshold Voltage Drift of GaN Cascode Power Modules
Y Gunaydin, S Jahdi, X Yuan, J Yang, R Yu, B Stark
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022
12022
Investigation of the static performance and avalanche reliability of high voltage 4h-sic merged-pin-schottky diodes
C Shen, S Jahdi, P Mellor, J Yang, E Bashar, J Ortiz-Gonzalez, O Alatise
2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022
12022
Investigation on threshold voltage instability under sweeping and DC gate bias stressing of SiC symmetrical and asymmetrical double-trench MOSFETs
J Yang, S Jahdi, B Stark, J Ortiz-Gonzalez, R Wu, O Alatise, P Mellor
IET Digital Library, 2022
12022
The impact of electrothermal stress on threshold voltage drift of gan and SIC cascode devices
Y Gunaydin, S Jahdi, X Yuan, J Yang, B Stark, J Ortiz-Gonzalez, R Wu, ...
IET Digital Library, 2022
12022
Reliability analysis of planar and symmetrical & asymmetrical trench discrete SiC Power MOSFETs
J Yang
The University of Bristol, 2023
2023
Electrothermal Power Cycling to Failure of Discrete Planar, Symmetrical Double-Trench & Asymmetrical Trench SiC MOSFETs
J Yang, S Jahdi, R Yu, B Stark
IEEE Open Journal of Power Electronics, 2023
2023
Evaluation of the Impact of Switching Speed on Inductors in SiC Converters
B Cui, J Wang, J Yang, X Yuan
PCIM Europe 2023; International Exhibition and Conference for Power …, 2023
2023
Degradation Pattern of Parallel Symmetrical and Asymmetrical Double-Trench SiC MOSFETs under Repetitive Short Circuits
R Yu, S Jahdi, J Yang, P Mellor, JO Gonzalez, O Alatise
PCIM Europe 2023; International Exhibition and Conference for Power …, 2023
2023
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