| Origin of the diffusion-related optical degradation of 1.3 μm InAs QD-LDs epitaxially grown on silicon substrate M Buffolo, F Lain, M Zenari, C De Santi, J Norman, JE Bowers, ... IEEE Journal of Selected Topics in Quantum Electronics 28 (1: Semiconductor …, 2021 | 12 | 2021 |
| Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications M Zenari, M Buffolo, C De Santi, J Norman, G Meneghesso, JE Bowers, ... Journal of Physics D: Applied Physics 54 (28), 285101, 2021 | 10 | 2021 |
| Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon M Zenari, M Buffolo, C De Santi, C Shang, E Hughes, Y Wan, RW Herrick, ... Microelectronics Reliability 138, 114714, 2022 | 5 | 2022 |
| Understanding the optical degradation of 845 nm micro-transfer-printed VCSILs for photonic integrated circuits M Zenari, M Buffolo, M Fornasier, C De Santi, J Goyvaerts, A Grabowski, ... IEEE Journal of Quantum Electronics 59 (4), 1-10, 2023 | 4 | 2023 |
| Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate M Zenari, M Buffolo, C De Santi, J Norman, RW Herrick, G Meneghesso, ... Microelectronics Reliability 126, 114222, 2021 | 3 | 2021 |
| Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization M Zenari, M Buffolo, C De Santi, J Norman, ET Hughes, JE Bowers, ... ACS Photonics 10 (12), 4188-4195, 2023 | 2 | 2023 |
| Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics M Zenari, M Buffolo, C De Santi, J Goyvaerts, A Grabowski, J Gustavsson, ... IEEE Transactions on Electron Devices, 2024 | 1 | 2024 |
| Simulation of a Gas Turbine-Organic Rankine Cycle Combined Power Plant with the integration of a direct Thermal Energy Storage to improve flexibility M ZENARI | 1 | 2023 |
| Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon photonics: dependence on the number of dot-in-a-well layers M Zenari, M Gioannini, M Buffolo, A Tibaldi, C De Santi, J Norman, ... IEEE Journal of Selected Topics in Quantum Electronics, 2024 | | 2024 |
| Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics M Zenari, M Buffolo, F Rampazzo, C De Santi, F Rossi, L Lazzarini, ... IEEE Journal of Selected Topics in Quantum Electronics, 2024 | | 2024 |
| Lifetime-limiting mechanisms of integrated IR sources for silicon photonics M Buffolo, M Zenari, C De Santi, C Shang, J Norman, JE Bowers, ... Smart Photonic and Optoelectronic Integrated Circuits 2024 12890, 89-94, 2024 | | 2024 |
| Advanced Characterization and Modeling of Laser Diodes for Silicon Photonics M Zenari Università degli studi di Padova, 2024 | | 2024 |
| Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations M Zenari, M Buffolo, C De Santi, J Goyvaerts, A Grabowski, J Gustavsson, ... 2023 International Conference on Numerical Simulation of Optoelectronic …, 2023 | | 2023 |
| Degradation Processes and Aging in Quantum Dot Lasers on Silicon M Meneghini, M Buffolo, M Zenari, C De Santi, RW Herrick, C Shang, ... CLEO: Science and Innovations, SM2J. 1, 2023 | | 2023 |
| Modeling of the Optical and Electrical Degradation of 845 nm VCSILs M Buffolo, M Zenari, M Fornasier, C De Santi, J Goyvaerts, A Grabowski, ... 2023 Conference on Lasers and Electro-Optics (CLEO), 1-2, 2023 | | 2023 |
| Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits M Zenari, M Buffolo, M Fornasier, C De Santi, J Goyvaerts, A Grabowski, ... Vertical-Cavity Surface-Emitting Lasers XXVII 12439, 120-128, 2023 | | 2023 |
| Improving the reliability of InAs quantum-dot laser diodes for silicon photonics: the role of trapping layers and misfit-dislocation density M Buffolo, M Zenari, C De Santi, C Shang, E Hughes, Y Wan, JE Bowers, ... Novel In-Plane Semiconductor Lasers XXII 12440, 1244002, 2023 | | 2023 |
| Degradation mechanisms of laser diodes for silicon photonics applications C De Santi, M Buffolo, M Zenari, C Shang, JE Bowers, G Meneghesso, ... Quantum Sensing and Nano Electronics and Photonics XIX 12430, 44-48, 2023 | | 2023 |
| Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study M Zenari, M Buffolo, C De Santi, J Norman, G Meneghesso, JE Bowers, ... Nanoscale and Quantum Materials: From Synthesis and Laser Processing to …, 2022 | | 2022 |
| Optical degradation of InAs quantum-dot lasers on silicon: dependence on temperature and on diffusion processes M Buffolo, M Zenari, C De Santi, J Norman, JE Bowers, RW Herrick, ... Novel In-Plane Semiconductor Lasers XXI 12021, 40-46, 2022 | | 2022 |
