| Multilevel HfO2-based RRAM devices for low-power neuromorphic networks V Milo, C Zambelli, P Olivo, E Pérez, M K Mahadevaiah, O G Ossorio, ... APL materials 7 (8), 2019 | 171 | 2019 |
| Fundamental variability limits of filament-based RRAM A Grossi, E Nowak, C Zambelli, C Pellissier, S Bernasconi, G Cibrario, ... 2016 IEEE International Electron Devices Meeting (IEDM), 4.7. 1-4.7. 4, 2016 | 134 | 2016 |
| Architectural and integration options for 3D NAND flash memories R Micheloni, L Crippa, C Zambelli, P Olivo Computers 6 (3), 27, 2017 | 77 | 2017 |
| Accurate program/verify schemes of resistive switching memory (RRAM) for in-memory neural network circuits V Milo, A Glukhov, E Pérez, C Zambelli, N Lepri, MK Mahadevaiah, ... IEEE Transactions on Electron Devices 68 (8), 3832-3837, 2021 | 76 | 2021 |
| Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM A Grossi, E Vianello, C Zambelli, P Royer, JP Noel, B Giraud, L Perniola, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018 | 73 | 2018 |
| Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ... IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015 | 67 | 2015 |
| Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications A Grossi, E Vianello, MM Sabry, M Barlas, L Grenouillet, J Coignus, ... IEEE Transactions on Electron Devices 66 (3), 1281-1288, 2019 | 66 | 2019 |
| Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms E Pérez, A Grossi, C Zambelli, P Olivo, R Roelofs, C Wenger IEEE Electron Device Letters 38 (2), 175-178, 2016 | 63 | 2016 |
| Toward reliable multi-level operation in RRAM arrays: Improving post-algorithm stability and assessing endurance/data retention E Perez, C Zambelli, MK Mahadevaiah, P Olivo, C Wenger IEEE Journal of the Electron Devices Society 7, 740-747, 2019 | 61 | 2019 |
| Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ... Solid-State Electronics 115, 17-25, 2016 | 57 | 2016 |
| Solid-state drives: Memory driven design methodologies for optimal performance L Zuolo, C Zambelli, R Micheloni, P Olivo Proceedings of the IEEE 105 (9), 1589-1608, 2017 | 52 | 2017 |
| Nonvolatile memories: Present and future challenges EI Vatajelu, H Aziza, C Zambelli 2014 9th International Design and Test Symposium (IDT), 61-66, 2014 | 50 | 2014 |
| Reliability challenges in 3D NAND Flash memories C Zambelli, R Micheloni, P Olivo 2019 IEEE 11th International Memory Workshop (IMW), 1-4, 2019 | 43 | 2019 |
| Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices A Grossi, E Perez, C Zambelli, P Olivo, E Miranda, R Roelofs, J Woodruff, ... Scientific reports 8 (1), 11160, 2018 | 42 | 2018 |
| Statistical analysis of resistive switching characteristics in ReRAM test arrays C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ... 2014 international conference on microelectronic test structures (ICMTS), 27-31, 2014 | 37 | 2014 |
| Characterization of TLC 3D-NAND flash endurance through machine learning for LDPC code rate optimization C Zambelli, G Cancelliere, F Riguzzi, E Lamma, P Olivo, A Marelli, ... 2017 IEEE International Memory Workshop (IMW), 1-4, 2017 | 36 | 2017 |
| Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays E Pérez, A Grossi, C Zambelli, P Olivo, C Wenger IEEE Journal of the Electron Devices Society 5 (1), 64-68, 2016 | 34 | 2016 |
| Optimized programming algorithms for multilevel RRAM in hardware neural networks V Milo, F Anzalone, C Zambelli, E Pérez, MK Mahadevaiah, ÓG Ossorio, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 31 | 2021 |
| Cross-temperature effects of program and read operations in 2D and 3D NAND flash memories C Zambelli, L Crippa, R Micheloni, P Olivo 2018 International Integrated Reliability Workshop (IIRW), 1-4, 2018 | 30 | 2018 |
| Is consumer electronics redesigning our cars?: Challenges of integrated technologies for sensing, computing, and storage F Pieri, C Zambelli, A Nannini, P Olivo, S Saponara IEEE Consumer Electronics Magazine 7 (5), 8-17, 2018 | 30 | 2018 |
