| Development of a momentum microscope for time resolved band structure imaging B Krömker, M Escher, D Funnemann, D Hartung, H Engelhard, ... Review of Scientific Instruments 79 (5), 2008 | 167 | 2008 |
| NanoESCA: a novel energy filter for imaging x-ray photoemission spectroscopy M Escher, N Weber, M Merkel, C Ziethen, P Bernhard, G Schönhense, ... Journal of Physics: Condensed Matter 17 (16), S1329, 2005 | 139 | 2005 |
| Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope M Escher, K Winkler, O Renault, N Barrett Journal of Electron Spectroscopy and Related Phenomena 178, 303-316, 2010 | 83 | 2010 |
| Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES CM Schneider, C Wiemann, M Patt, V Feyer, L Plucinski, IP Krug, ... Journal of Electron Spectroscopy and Related Phenomena 185 (10), 330-339, 2012 | 78 | 2012 |
| Time-of-flight-photoelectron emission microscopy on plasmonic structures using attosecond extreme ultraviolet pulses SH Chew, F Süßmann, C Späth, A Wirth, J Schmidt, S Zherebtsov, ... Applied Physics Letters 100 (5), 2012 | 76 | 2012 |
| Characterisation and application of a SPLEED-based spin polarisation analyser D Yu, C Math, M Meier, M Escher, G Rangelov, M Donath Surface Science 601 (24), 5803-5808, 2007 | 69 | 2007 |
| A new nanospectroscopy tool with synchrotron radiation: NanoESCA@ Elettra C Wiemann, M Patt, IP Krug, NB Weber, M Escher, M Merkel, ... e-Journal of Surface Science and Nanotechnology 9, 395-399, 2011 | 59 | 2011 |
| NanoESCA: imaging UPS and XPS with high energy resolution M Escher, N Weber, M Merkel, B Krömker, D Funnemann, S Schmidt, ... Journal of electron spectroscopy and related phenomena 144, 1179-1182, 2005 | 59 | 2005 |
| Time of flight-photoemission electron microscope for ultrahigh spatiotemporal probing of nanoplasmonic optical fields J Lin, N Weber, A Wirth, SH Chew, M Escher, M Merkel, MF Kling, ... Journal of Physics: Condensed Matter 21 (31), 314005, 2009 | 48 | 2009 |
| High Voltage-Cylinder Sector Analyzer 300/15: A cylindrical sector analyzer for electron kinetic energies up to 15 keV J Rubio-Zuazo, M Escher, M Merkel, GR Castro Review of Scientific Instruments 81 (4), 2010 | 42 | 2010 |
| Bulk sensitive hard x-ray photoemission electron microscopy M Patt, C Wiemann, N Weber, M Escher, A Gloskovskii, W Drube, ... Review of scientific instruments 85 (11), 2014 | 40 | 2014 |
| Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter M Merkel, M Escher, J Settemeyer, D Funnemann, A Oelsner, C Ziethen, ... Surface science 480 (3), 196-202, 2001 | 38 | 2001 |
| Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation C Wiemann, M Patt, S Cramm, M Escher, M Merkel, A Gloskovskii, ... Applied Physics Letters 100 (22), 2012 | 36 | 2012 |
| Resolution deterioration in emission electron microscopy due to object roughness SA Nepijko, NN Sedov, G Schönhense, M Escher, X Bao, W Huang Annalen der Physik 512 (6), 441-451, 2000 | 35 | 2000 |
| FERRUM: a new highly efficient spin detector for electron spectroscopy M Escher, NB Weber, M Merkel, L Plucinski, CM Schneider e-Journal of Surface Science and Nanotechnology 9, 340-343, 2011 | 30 | 2011 |
| Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions M Lavayssière, M Escher, O Renault, D Mariolle, N Barrett Journal of Electron Spectroscopy and Related Phenomena 186, 30-38, 2013 | 18 | 2013 |
| Peculiarities of imaging one‐and two‐dimensional structures in an emission electron microscope. 1. Theory SA Nepijko, NN Sedov, CH Ziethen, G Schönhense, M Merkel, M Escher Journal of Microscopy 199 (2), 124-129, 2000 | 17 | 2000 |
| Testing of lateral resolution in the nanometre range using the BAM-l002-certified reference material: application to ToF-SIMS IV and NanoESCA instruments M Senoner, T Wirth, WES Unger, M Escher, N Weber, D Funnemann, ... Journal of Surface analysis 12 (2), 78, 2005 | 16 | 2005 |
| Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy A Bailly, O Renault, N Barrett, T Desrues, D Mariolle, LF Zagonel, ... Journal of Physics: Condensed Matter 21 (31), 314002, 2009 | 15 | 2009 |
| Use of emission electron microscope for potential mapping in semiconductor microelectronics SA Nepijko, NN Sedov, G Schönhense, M Escher Journal of microscopy 206 (2), 132-138, 2002 | 15 | 2002 |
