| Performance of wide-bandgap gallium nitride vs silicon carbide cascode transistors Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, R Wu, B Stark, M Hedayati, ... 2020 IEEE Energy Conversion Congress and Exposition (ECCE), 239-245, 2020 | 6 | 2020 |
| Performance of wide-bandgap discrete and module cascodes at sub-1 kV: GaN vs. SiC Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, R Wu, B Stark, M Hedayati, ... Microelectronics reliability 125, 114362, 2021 | 4 | 2021 |
| Impact of temperature and switching rate on forward and reverse conduction of gan and sic cascode devices: A technology evaluation Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, M Hedayati, B Stark, J Yang, ... IET Digital Library, 2021 | 4 | 2021 |
| Analysis of Performance and Reliability of Sub-kV SiC and GaN Cascode Power Electronic Devices Y Gunaydin The University of Bristol, 2023 | 3 | 2023 |
| Analysis of cyclic spontaneous switchings in gan & sic cascodes by snappy turn-off currents Y Gunaydin, S Jahdi, O Alatise, JA Ortiz-Gonzalez, A Aithal, X Yuan, ... Microelectronics reliability 114, 113752, 2020 | 3 | 2020 |
| Analysis of 1st & 3rd Quadrant Electrothermal Robustness of Symmetrical and Asymmetrical Double- Trench SiC Power MOSFETs Under UIS M Hosseinzadehlish, S Jahdi, X Yuan, C Shen, Y Gunaydin, I Laird, ... 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022 | 2 | 2022 |
| Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures Y Gunaydin, S Jahdi, X Yuan, R Yu, C Shen, SP Munagala, A Hopkins, ... Microelectronics Reliability 138, 114711, 2022 | 1 | 2022 |
| Transfer IV and Threshold Voltage Drift of GaN and SiC Cascode Discrete Devices Under Gate Bias Stress Y Gunaydin, S Jahdi, X Yuan, B Stark, J Ortiz-Gonzalez, E Bashar, ... PCIM Europe 2022; International Exhibition and Conference for Power …, 2022 | 1 | 2022 |
| Electrothermal power cycling of GaN and SiC cascode devices Y Gunaydin, S Jahdi, R Yu, X Yuan, O Alatise, JO Gonzalez Microelectronics Reliability 150, 115117, 2023 | | 2023 |
| Experimental Analysis of Short Circuit Robustness of GaN and SiC Cascode Devices Y Gunaydin, S Jahdi, X Yuan, C Shen, M Hosseinzadelish, R Yu, ... PCIM Europe 2023; International Exhibition and Conference for Power …, 2023 | | 2023 |
| Impact of Electrothermal Bias Temperature Instability Stress on Threshold Voltage Drift of GaN Cascode Power Modules Y Gunaydin, S Jahdi, X Yuan, J Yang, R Yu, B Stark 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022 | | 2022 |
| The impact of electrothermal stress on threshold voltage drift of gan and SIC cascode devices Y Gunaydin, S Jahdi, X Yuan, J Yang, B Stark, J Ortiz-Gonzalez, R Wu, ... IET Digital Library, 2022 | | 2022 |
Saeed JahdiSenior Lecturer in Power Electronics, University of Bristol在 bristol.ac.uk 的电子邮件经过验证
