Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy OL Krivanek, MF Chisholm, V Nicolosi, TJ Pennycook, GJ Corbin, ... Nature 464 (7288), 571-574, 2010 | 1479 | 2010 |
Sub-ångstrom resolution using aberration corrected electron optics PE Batson, N Dellby, OL Krivanek Nature 418 (6898), 617-620, 2002 | 1196 | 2002 |
Towards sub-Å electron beams OL Krivanek, N Dellby, AR Lupini Ultramicroscopy 78 (1-4), 1-11, 1999 | 796 | 1999 |
Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ... Nature 514 (7521), 209-212, 2014 | 771 | 2014 |
Surface roughness at the Si(100)- interface SM Goodnick, DK Ferry, CW Wilmsen, Z Liliental, D Fathy, OL Krivanek Physical Review B 32 (12), 8171, 1985 | 755 | 1985 |
Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy DA Muller, LF Kourkoutis, M Murfitt, JH Song, HY Hwang, J Silcox, ... Science 319 (5866), 1073-1076, 2008 | 748 | 2008 |
Direct sub-angstrom imaging of a crystal lattice PD Nellist, MF Chisholm, N Dellby, OL Krivanek, MF Murfitt, ZS Szilagyi, ... Science 305 (5691), 1741-1741, 2004 | 680 | 2004 |
EELS atlas: a reference collection of electron energy loss spectra covering all stable elements CC Ahn, OL Krivanek, RP Burgner, MM Disko, PR Swann (No Title), 1983 | 481 | 1983 |
Spectroscopic imaging of single atoms within a bulk solid M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ... Physical Review Letters 92 (9), 095502, 2004 | 398 | 2004 |
An electron microscope for the aberration-corrected era OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ... Ultramicroscopy 108 (3), 179-195, 2008 | 377 | 2008 |
ELNES of 3d transition-metal oxides: II. Variations with oxidation state and crystal structure JH Paterson, OL Krivanek Ultramicroscopy 32 (4), 319-325, 1990 | 272 | 1990 |
Parallel detection electron spectrometer using quadrupole lenses OL Krivanek, CC Ahn, RB Keeney Ultramicroscopy 22 (1-4), 103-115, 1987 | 256 | 1987 |
Towards sub-0.5 Å electron beams OL Krivanek, PD Nellist, N Dellby, MF Murfitt, Z Szilagyi Ultramicroscopy 96 (3-4), 229-237, 2003 | 238 | 2003 |
Gentle STEM: ADF imaging and EELS at low primary energies OL Krivanek, N Dellby, MF Murfitt, MF Chisholm, TJ Pennycook, ... Ultramicroscopy 110 (8), 935-945, 2010 | 229 | 2010 |
Site-specific valence determination by electron energy-loss spectroscopy J Taftø, OL Krivanek Physical Review Letters 48 (8), 560, 1982 | 224 | 1982 |
Applications of slow-scan CCD cameras in transmission electron microscopy OL Krivanek, PE Mooney Ultramicroscopy 49 (1-4), 95-108, 1993 | 214 | 1993 |
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, ... Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009 | 202 | 2009 |
Lattice imaging of a grain boundary in crystalline germanium OL Krivanek, S Isoda, K Kobayashi Philosophical Magazine 36 (4), 931-940, 1977 | 190 | 1977 |
Design and first applications of a post-column imaging filter OL Krivanek, AJ Gubbens, N Dellby, CE Meyer Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992 | 185 | 1992 |
Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope JA Hachtel, J Huang, I Popovs, S Jansone-Popova, JK Keum, J Jakowski, ... Science 363 (6426), 525-528, 2019 | 176 | 2019 |