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Rohit Singh
Rohit Singh
Electrical Engineering, University of Waterloo
在 uwaterloo.ca 的电子邮件经过验证
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CMOS reliability from past to future: A survey of requirements, trends, and prediction methods
I Hill, P Chanawala, R Singh, SA Sheikholeslam, A Ivanov
IEEE Transactions on Device and Materials Reliability 22 (1), 1-18, 2021
312021
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