| Reconfigurable high performance architectures: How much are they ready for safety-critical applications? D Sabena, L Sterpone, M Schölzel, T Koal, HT Vierhaus, S Wong, R Glein, ... 2014 19th IEEE European Test Symposium (ETS), 1-8, 2014 | 21 | 2014 |
| Fine-grained software-based self-repair of VLIW processors M Schölzel 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 21 | 2011 |
| Combining hardware-and software-based self-repair methods for statically scheduled data paths M Schölzel, S Müller 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI …, 2010 | 21 | 2010 |
| Towards an automatic generation of diagnostic in-field sbst for processor components M Schölzel, T Koal, S Röder, HT Vierhaus 2013 14th Latin American Test Workshop-LATW, 1-6, 2013 | 20 | 2013 |
| On the feasibility of built-in self repair for logic circuits T Koal, D Scheit, M Schölzel, HT Vierhaus 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 20 | 2011 |
| Combining fault tolerance and self repair at minimum cost in power and hardware T Koal, M Schölzel, HT Vierhaus 17th International Symposium on Design and Diagnostics of Electronic …, 2014 | 16 | 2014 |
| Systematic generation of diagnostic software-based self-test routines for processor components M Schölzel, T Koal, HT Vierhaus 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 15 | 2014 |
| Reduced Triple Modular redundancy for built-in self-repair in VLIW-processors M Schölzel Signal Processing Algorithms, Architectures, Arrangements, and Applications …, 2007 | 14 | 2007 |
| Advanced technical education in the age of cyber physical systems HT Vierhaus, M Schölzel, J Raik, R Ubar 10th European Workshop on Microelectronics Education (EWME), 193-198, 2014 | 12 | 2014 |
| Towards a graceful degradable multicore-system by hierarchical handling of hard errors S Müller, M Schölzel, HT Vierhaus 2013 21st Euromicro International Conference on Parallel, Distributed, and …, 2013 | 11 | 2013 |
| Multiple fault testing in systems-on-chip with high-level decision diagrams R Ubar, SA Oyeniran, M Scholzel, HT Vierhaus 2015 10th International Design & Test Symposium (IDT), 66-71, 2015 | 10 | 2015 |
| Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults M Schölzel, T Koal, HT Vierhaus 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014 | 9 | 2014 |
| On reliability estimation for combined transient and permanent fault handling S Scharoba, M Schölzel, T Koal, HT Vierhaus 2014 14th Biennial Baltic Electronic Conference (BEC), 73-76, 2014 | 7 | 2014 |
| On performance estimation of a scalable VLIW soft-core in XILINX FPGAs P Pfeifer, Z Plíva, M Schölzel, T Koal, HT Vierhaus 2013 IEEE 16th International Symposium on Design and Diagnostics of …, 2013 | 7 | 2013 |
| Proposal of vliw architecture for application specific processors with built-in-self-repair facility via variable accuracy arithmetic P Pawlowski, A Dabrowski, M Scholzel 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems, 1-6, 2007 | 7 | 2007 |
| Timing for virtual TMR in logic circuits S Müller, T Koal, M Schölzel, HT Vierhaus 2014 IEEE 20th International On-Line Testing Symposium (IOLTS), 190-193, 2014 | 6 | 2014 |
| On performance estimation of a scalable VLIW soft-core on ALTERA and XILINX FPGA platforms P Pfeifer, Z Plíva, M Schölzel, T Koal, HT Vierhaus 2013 International Conference on Applied Electronics, 1-4, 2013 | 6 | 2013 |
| Software-based repair for memories in tiny embedded systems M Schölzel, P Skoncej 2015 20th IEEE European Test Symposium (ETS), 1-2, 2015 | 5 | 2015 |
| On the feasibility of handling manufacturing faults in embedded memories by software means M Schölzel, P Skoncej, F Vater 2015 IEEE International Workshop of Electronics, Control, Measurement …, 2015 | 2 | 2015 |
| Compiler-Centred Microprocessor Design (CoMet)-From C-Code to a VHDL Model of an ASIP R Urban, M Schölzel, HT Vierhaus, E Altmann, H Seelig 2015 IEEE 18th International Symposium on Design and Diagnostics of …, 2015 | 2 | 2015 |
