Use of a rapid cytotoxicity screening approach to engineer a safer zinc oxide nanoparticle through iron doping S George, S Pokhrel, T Xia, B Gilbert, Z Ji, M Schowalter, A Rosenauer, ... ACS nano 4 (1), 15-29, 2010 | 576 | 2010 |
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ... Nature communications 5 (1), 5653, 2014 | 301 | 2014 |
Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images A Rosenauer, K Gries, K Müller, A Pretorius, M Schowalter, A Avramescu, ... Ultramicroscopy 109 (9), 1171-1182, 2009 | 207 | 2009 |
Gain studies of (Cd, Zn) Se quantum islands in a ZnSe matrix M Strassburg, V Kutzer, UW Pohl, A Hoffmann, I Broser, NN Ledentsov, ... Applied physics letters 72 (8), 942-944, 1998 | 197 | 1998 |
Composition mapping in InGaN by scanning transmission electron microscopy A Rosenauer, T Mehrtens, K Müller, K Gries, M Schowalter, PV Satyam, ... Ultramicroscopy 111 (8), 1316-1327, 2011 | 184 | 2011 |
Digital analysis of high-resolution transmission electron microscopy lattice images A Rosenauer Optik 102, 63-69, 1996 | 171 | 1996 |
Extracting quantitative information from high resolution electron microscopy S Kret, P Ruterana, A Rosenauer, D Gerthsen physica status solidi (b) 227 (1), 247-295, 2001 | 163 | 2001 |
Procedure to count atoms with trustworthy single-atom sensitivity S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ... Physical Review B—Condensed Matter and Materials Physics 87 (6), 064107, 2013 | 161 | 2013 |
Structural and chemical analysis of CdSe/ZnSe nanostructures by transmission electron microscopy N Peranio, A Rosenauer, D Gerthsen, SV Sorokin, IV Sedova, SV Ivanov Physical Review B 61 (23), 16015, 2000 | 161 | 2000 |
Tin-Assisted Synthesis of by Molecular Beam Epitaxy M Kracht, A Karg, J Schörmann, M Weinhold, D Zink, F Michel, M Rohnke, ... Physical Review Applied 8 (5), 054002, 2017 | 155 | 2017 |
STEMSIM—a new software tool for simulation of STEM HAADF Z-contrast imaging A Rosenauer, M Schowalter Microscopy of semiconducting materials 2007, 170-172, 2008 | 151 | 2008 |
Entropy-limited topological protection of skyrmions J Wild, TNG Meier, S Pöllath, M Kronseder, A Bauer, A Chacon, M Halder, ... Science advances 3 (9), e1701704, 2017 | 147 | 2017 |
Protein adsorption on colloidal alumina particles functionalized with amino, carboxyl, sulfonate and phosphate groups F Meder, T Daberkow, L Treccani, M Wilhelm, M Schowalter, ... Acta biomaterialia 8 (3), 1221-1229, 2012 | 144 | 2012 |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ... Ultramicroscopy 178, 62-80, 2017 | 135 | 2017 |
Quantification of segregation and mass transport in In x Ga 1− x A s/G a A s Stranski-Krastanow layers A Rosenauer, D Gerthsen, D Van Dyck, M Arzberger, G Böhm, ... Physical Review B 64 (24), 245334, 2001 | 132 | 2001 |
Composition fluctuations in InGaN analyzed by transmission electron microscopy D Gerthsen, E Hahn, B Neubauer, A Rosenauer, O Schön, M Heuken, ... physica status solidi (a) 177 (1), 145-155, 2000 | 132 | 2000 |
A pnCCD-based, fast direct single electron imaging camera for TEM and STEM H Ryll, M Simson, R Hartmann, P Holl, M Huth, S Ihle, Y Kondo, P Kotula, ... Journal of Instrumentation 11 (04), P04006, 2016 | 129 | 2016 |
Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations A De Backer, GT Martinez, A Rosenauer, S Van Aert Ultramicroscopy 134, 23-33, 2013 | 120 | 2013 |
Investigations on the Stranski–Krastanow growth of CdSe quantum dots D Schikora, S Schwedhelm, DJ As, K Lischka, D Litvinov, A Rosenauer, ... Applied Physics Letters 76 (4), 418-420, 2000 | 109 | 2000 |
Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state A Rosenauer Springer Science & Business Media, 2003 | 103 | 2003 |