关注
Maan Kokash
Maan Kokash
Sr. Manufacturing Engineer at BAE Systems
在 binghamton.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Isothermal fatigue of interconnections in flexible hybrid electronics based human performance monitors
RS Sivasubramony, N Adams, M Alhendi, GS Khinda, MZ Kokash, ...
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 896-903, 2018
222018
Effects of oven and laser sintering parameters on the electrical resistance of ijp nano-silver traces on mesoporous pet before and during fatigue cycling
GS Khinda, MZ Kokash, M Alhendi, M Yadav, JP Lombardi, ...
2019 IEEE 69th Electronic Components and Technology Conference (ECTC), 1946-1951, 2019
182019
Fatigue cycling of electrical interconnects dispensed on flexible substrate
M Alhendi, JP Lombardi III, GS Khinda, MZ Kokash, DL Weerawarne, ...
International Symposium on Microelectronics 2018 (1), 000543-000548, 2018
122018
Fatigue testing of copper nanoparticle-based joints and bonds
RS Sivasubramony, MZ Kokash, S Thekkut, N Shahane, P Thompson, ...
Journal of Electronic Packaging 144 (1), 011007, 2022
92022
Assessing the reliability of high temperature solder alternatives
MZ Kokash, RS Sivasubramony, JLT Cuevas, AF Zamudio, P Borgesen, ...
2017 IEEE 67th Electronic Components and Technology Conference (ECTC), 1987-1995, 2017
92017
Optimization in Pharmaceutical Supply Chain Inventory management for Disaster Planning
L He, JLT Cuevas, MZ Kokash, EA Banimustafa, MT Khasawneh
IIE Annual Conference. Proceedings, 1583-1588, 2017
82017
Inelastic Deformation of Copper Nanoparticle Based Joints and Bonds
S Thekkut, MZ Kokash, RS Sivasubramony, Y Kawana, K Mirpuri, ...
Journal of Electronic Packaging 144 (3), 031009, 2022
62022
Deformation and damage of copper and nano copper based joints
MZ Kokash
State University of New York at Binghamton, 2015
62015
Fatigue behaviour of inkjet-printed silver interconnects on silica-coated mesoporous flexible PET substrate
GS Khinda, MZ Kokash, M Alhendi, B Garakani, NC Stoffel, P Borgesen, ...
Flexible and Printed Electronics 7 (1), 015011, 2022
42022
Damage Accumulation in Printed Interconnects on Flex Under Combinations of Bending and Tension With Different Amplitudes
RS Sivasubramony, M Alhendi, MZ Kokash, M Yadav, A Raj, S Thekkut, ...
2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 1225-1233, 2020
32020
Assessing the reliability of fused/sintered Nano-particles
MZ Kokash
State University of New York at Binghamton, 2019
22019
Printed Circuit Board Reliability Improvement Using Total Quality Management Techniques
MZ Kokash, T Alghoul, S Al-Hihi, M Alhendi, C Greene
IIE Annual Conference. Proceedings, 455-460, 2018
2018
系统目前无法执行此操作,请稍后再试。
文章 1–12